Detail publikace

NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SCANNING TUNNELLING MICROSCOPY IN DEFECTOSCOPY

Kala,J.

Originální název

NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SCANNING TUNNELLING MICROSCOPY IN DEFECTOSCOPY

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper is dealing with a conjuction of STM and SNOM methods in defectoscopy. First part is focused on common description of STM method, the tunnel effect and two modes of TS 3130 which is instrument for STM made by Tescan are described. Next part gives details about SNOM method and its advantages and disadvantages in the local nondestructive measurement.

Klíčová slova

STM, SPM, SNOM, defectoscopy

Autoři

Kala,J.

Rok RIV

2005

Vydáno

28. 4. 2005

Nakladatel

VUT Brno

Místo

Brno

ISBN

80-214-2889-9

Kniha

Proceedings of the 11th conference student EEICT 2005 volume 2

Číslo edice

2

Strany od

256

Strany do

260

Strany počet

5

BibTex

@inproceedings{BUT14581,
  author="Jaroslav {Kala}",
  title="NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SCANNING TUNNELLING MICROSCOPY IN DEFECTOSCOPY",
  booktitle="Proceedings of the 11th conference student EEICT 2005 volume 2",
  year="2005",
  volume="11",
  number="2005",
  pages="5",
  publisher="VUT Brno",
  address="Brno",
  isbn="80-214-2889-9"
}