Publication detail

NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SCANNING TUNNELLING MICROSCOPY IN DEFECTOSCOPY

Kala,J.

Original Title

NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SCANNING TUNNELLING MICROSCOPY IN DEFECTOSCOPY

Type

conference paper

Language

English

Original Abstract

This paper is dealing with a conjuction of STM and SNOM methods in defectoscopy. First part is focused on common description of STM method, the tunnel effect and two modes of TS 3130 which is instrument for STM made by Tescan are described. Next part gives details about SNOM method and its advantages and disadvantages in the local nondestructive measurement.

Keywords

STM, SPM, SNOM, defectoscopy

Authors

Kala,J.

RIV year

2005

Released

28. 4. 2005

Publisher

VUT Brno

Location

Brno

ISBN

80-214-2889-9

Book

Proceedings of the 11th conference student EEICT 2005 volume 2

Edition number

2

Pages from

256

Pages to

260

Pages count

5

BibTex

@inproceedings{BUT14581,
  author="Jaroslav {Kala}",
  title="NEAR-FIELD SCANNING OPTICAL MICROSCOPY AND SCANNING TUNNELLING MICROSCOPY IN DEFECTOSCOPY",
  booktitle="Proceedings of the 11th conference student EEICT 2005 volume 2",
  year="2005",
  volume="11",
  number="2005",
  pages="5",
  publisher="VUT Brno",
  address="Brno",
  isbn="80-214-2889-9"
}