Detail publikace

A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs

Originální název

A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs

Anglický název

A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs

Jazyk

en

Originální abstrakt

This work presents a test method that allows in-situ measurements of radiation-induced changes in measurement accuracy of high resolution analog to digital converters. These converters are typically used in the data acquisition system of scientific instruments for space missions. The results of the radiation experiments on various commercial converters will be presented and discussed. The influence on the DC accuracy and integral non-linearity will be covered.

Anglický abstrakt

This work presents a test method that allows in-situ measurements of radiation-induced changes in measurement accuracy of high resolution analog to digital converters. These converters are typically used in the data acquisition system of scientific instruments for space missions. The results of the radiation experiments on various commercial converters will be presented and discussed. The influence on the DC accuracy and integral non-linearity will be covered.

Dokumenty

BibTex


@misc{BUT134650,
  author="Jiří {Hofman} and Jiří {Háze} and Richard {Sharp}",
  title="A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs",
  annote="This work presents a test method that allows in-situ measurements of radiation-induced changes in measurement accuracy of high resolution analog to digital converters. These converters are typically used in the data acquisition system of scientific instruments for space missions. The results of the radiation experiments on various commercial converters will be presented and discussed. The influence on the DC accuracy and integral non-linearity will be covered.",
  chapter="134650",
  year="2017",
  month="march",
  type="lecture"
}