Publikace

• 2023

  ALMOTASEM, A.; DAGHBOUJ, N.; SEN, H.; MIRZAEI, S.; CALLISTI, M.; POLCAR, T. Influence of HCP/BCC interface orientation on the tribological behavior of Zr/Nb multilayer during nanoscratch: A combined experimental and atomistic study. ACTA MATERIALIA, 2023, roč. 249, č. 118832, ISSN: 1873-2453.
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• 2022

  HABIBI, M.; SADEGHI, M.; ARMAN, A.; SOBOLA, D.; LUNA, C.; MIRZAEI, S.; ZELATI, A.; DA FONSECA, H.D.; ŢĂLU, Ş. Corrosion resistance and surface microstructure of Mg3N2/SS thin films by plasma focus instrument. MICROSCOPY RESEARCH AND TECHNIQUE, 2022, roč. 85, č. 8, s. 2880-2893. ISSN: 1097-0029.
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  DABEES, S.; MIRZAEI, S.; KASPAR, P.; HOLCMAN, V.; SOBOLA, D. Characterization and Evaluation of Engineered Coating Techniques for Different Cutting Tools-Review. Materials, 2022, roč. 15, č. 16, s. 1-40. ISSN: 1996-1944.
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  GHOBADI, N.; ARMAN, A.; SADEGHI, M.; LUNA, C.; MIRZAEI, S.; ZELATI, A.; SHAKOURY, R. Optical transitions and photocatalytic activity of NiSe films prepared by the chemical solution deposition method. European Physical Journal Plus, 2022, roč. 137, č. 6, s. 661-1 (661-9 s.)ISSN: 2190-5444.
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  Habibi, M.; Mirzaei, S.; Arman, A.; Jurecka, S.; Sadeghi, M.; Zelati, A.; Shakoury, R.; Tanhaee, E.; Ghobadi, N. ; Ehteram, H. ; Talu, S. Microstructure, fractal geometry and corrosion properties of CrN thin films: The effect of shot number and angular position. Materials Today Communications, 2022, roč. 32, č. 104072, ISSN: 2352-4928.
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  Bodner, SC.; Hlushko, K.; van de Vorst, LTG.; Meindlhumer, M.; Todt, J.; Nielsen, MA.; Hooijmans, JW.; Saurwalt, JJ.; Mirzaei, S.; Keckes, J. Graded Inconel-stainless steel multi-material structure by inter- and intralayer variation of metal alloys. Journal of Materials Research and Technology-JMR&T, 2022, roč. 21, č. 1, s. 4846-4859. ISSN: 2214-0697.
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• 2021

  Sadeghi, M.; Zelati, A.; Boochani, A.; Arman, A.; Mirzaei, S. Comparing half-metallic, MOKE, and thermoelectric behavior of the CrTiZ (Z = As, P) half-Heuslers: a DFT study. Materials Research Express, 2021, roč. 8, č. 4, s. 1-11. ISSN: 2053-1591.
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  SHAKOURY, R.; TALEBANI, N.; ZELATI, A.; TALU, S.; ARMAN, A.; MIRZAEI, S.; JAFARI, A. The effect of thickness and film homogeneity on the optical and microstructures of the ZrO2 thin films prepared by electron beam evaporation method. Optical and Quantum Electronics, 2021, roč. 53, č. 8, s. 441-1 (441-12 s.)ISSN: 1572-817X.
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*) Citace publikací se generují jednou za 24 hodin.