The curriculum concentrates on the comprehensive study of materials properties and failure processes from the point of view of physics and physical metallurgy. Students should develop capability to apply their knowledge in inventive manner to new technologies and materials, such as plasma spraying, special methods of thermo-mechanical and thermo-chemical treatment, etc. Special attention is paid to the degradation processes and to the synergetic effects of various materials properties on material failure. The subjects of study are metallic and non-metallic materials, e.g., structural ceramics, polymers, amorphous and nanocrystalline materials and intermetallics.
The Ph.D. programme requires proficiency in mathematics and physics at the MSc. degree level obtained from Faculty of Science or Faculty of Mechanical Engineering.

prof. RNDr. Miroslav Liška, DrSc.

1. Diffraction contrast in STEM and application in measurement of electron microscope optical properties

   Sample imaging in scanning transmission electron microscope (STEM) or transmission scanning electron microscope (TSEM) are standard microscopical techniques. But they can be also used for determination of aberration coefficients which is based on computer processing of amorphous sample images. The knowledge of the aberration coefficients is necessary for alignment of corrected electron microscopes. The standard approaches are based on Ronchigram - shading image of the specimen measured on 2D pixel detector behind the sample. The aberration coefficients can be determined from one or low number of Ronchigrams. If the microscope is not equipped by this detector the aberration coefficients can be determined from form series of diffractograms - Fourier transformations of amorphous specimen images with different sample tilt. The work will be concern on development and optimization of the method for system with 2D segmented detector behind the sample. It will cover design, simulations and experimental verification of the method.

   Tutor: Radlička Tomáš, Mgr., Ph.D.

2. Electrostatic deflection and correction systems

   Design of electrostatic deflection and correction systems. In electron beam lithography it is necessary to use dynamic focusing and dynamic stigmators to correct the aberrations of deflection system for obtaining an optimum shape of spots. The aim of the thesis is to study the dynamic correctors and to design an optical system for electron beam lithography.

   Tutor: Lencová Bohumila, prof. RNDr., CSc.

3. Modern methods of design of electron optics systems and aberration coefficients determination

   - matrix method for computations in electron optics - influence of tolerancing and 5th order aberrations - implementation of the differential algebra method for the computation of aberration coefficients of an arbitrary order

   Tutor: Lencová Bohumila, prof. RNDr., CSc.