Czech

Not applicable.

Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".

An examination composed from oral and written part.
Participation at every course parts.

Describe physical principles of selected measuring methods and measuring equipments.
Understanding of selected physical principles and their application in measurements, sensors and equipments.

Not applicable.

Not applicable.

DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
ORNATSKIJ, P.P.: Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976.
Normy: Mezinárodní slovník základních a všeobecných termínů v metrologii.. ČSN 01 0115
BOX, G.E.P., HUNTER, W.G., HUNTER, J.S. Statistics for Experiments-an Introduction to Design, Data Analysis and Model Building, Wiley 1978 (EN)
RIPKA, P.; TIPEK, A. Master Book of Sensors, part A, part B, Czech Technical University, 2003 (EN)
WIESENDAGER. R., GUNTHERODT. J.H.: Scanning Tuneling Microscopy II, Springer 1995 (EN)
REIMER, L, Scanning Electron Microscopy (2nd ed.), Springer,1998 (EN)
WILIAMS, D. B., CARTER, C. B. Transmission Electron Microscopy (2nd ed.), Springer, 2009 (EN)

DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
Normy: Vyjadřování nejistoty při měření.
JENČÍK, J., KUHN, L. a další: Technická měření ve strojírenství.. Praha: SNTL, 1982.

20 hours, optionally

General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.

Sensors: general classification, capacity sensors, sensors based on induction.

Advanced methods of visualisation and diagnostics: scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.