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Course detail
FSI-WA1-AAcad. year: 2023/2024
The course covers the folowing topics (with various degree of detail):light microscopy, image analysis, laser scanning confocal microscopy (CLSM), common elements and functional blocks of electron microscopes, electron-matter interaction, scanning electron microscopy (SEM), special techniques in SEM, overview of methods of local chemical composition analysis, energy-dispersive spectroscopy (EDS), focused ion beam microscopy (FIB).
Language of instruction
Number of ECTS credits
Mode of study
Guarantor
Department
Offered to foreign students
Entry knowledge
Rules for evaluation and completion of the course
Teaching is supported by the BUT e-learning system.
Attendance in practical lessons is compulsory. Absence from classes is dealt with individually, usually by make-up exercises.
The exam is only written, in the form of on-line test. The course-unit credit is granted under condition of elaboration of the assigned projects.
Aims
The course objective is to offer the students an overview and also the theoretical knowledge on principles of all basic methods for analyses of structure of materials and its phase composition, including sample preparation techniques. Based on practical demonstrations, the students will gain basic overview of procedures and methods used to solve problems and analysing results.
Based on this knowledge, the student should be able to select appropriate analytical techniqe to solve practical problems in materials' engineering.
Study aids
e-learing platform Moodle in BUT.
Prerequisites and corequisites
Basic literature
Recommended reading
Classification of course in study plans
Lecture
Teacher / Lecturer
Syllabus
The topics of the subject are going to be lectured in the following indicative order (actual order will be established according to organizational opportunities):- light microscopy (repetition and broadening of knowledge gained in the subject Introduction to Material Science and Engineering - BUM)- image analysis- laser scanning confocal microscopy (CLSM)- common elements and functional blocks of electron microscopes- electron-matter interaction- scanning electron microscopy (SEM)- overview of methods of local chemical composition analysis- energy-dispersive spectroscopy (EDS)- wave-dispersive spectroscopy (WDS)- algorithms of chemical composition quantitation based on EDS/WDS measurement- focused ion beam microscopy (FIB)
Laboratory exercise