Czech

2

Not applicable.

Knowledge of electromagnetism on the level defined by the textbook HALLIDAY, D. - RESNICK, R. - WALKER, J.: Fundamentals of Physics. J. Wiley and Sons.

credits, based on final discussion
Participation at lectures

After succesfull passing the course, the students should be able to:
- describe the construction of various types electron microscopes
- characterise individual physical phenomena yielding the image and discuss the function of the aparatus blocks
- evaluate the utility of different types EM for particular sample measurement.
Knowledge of the principles of construction of electron microscope and functionality of its parts.

Not applicable.

Not applicable.

GOLDSTEIN, Joseph I. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer Academic/Plenum publishers, 2003. xix, 689 s. ISBN 0-306-47292-9
REIMER, Ludwig. Transmission Electron Microscopy :Physics of Image Formation and Microanalysis. 3. ed. Berlin, 1993. 545 s. ISBN 3-540-56849-2
REIMER, Ludwig. Scanning electron microscopy :physics of image formation and microanalysis. Berlin, 1985. 457 s. ISBN 3-540-13530-8

Not applicable.

26 hours, optionally

1. Basics of scanning and transmission electron microscopy
2. Applications of electron microscopy
3. Electron and ion optics
4. Sources of electrons and ions
5. Interaction of electrons and ions with solid state matter
6. Ssignal detection im electron microscopy
7. Vacuum system
8. Sample manipulation inside electron microscope
9. Sample stages
10. Electron microscope as a system
11. Contrast of image 1. (SEM)
12. Contrast of image 2. (TEM)
13. Electron microscope as an analytical lab
14. Mopdern trends in electron microscopy
15. Practical demonstration