Course detail

Diagnostics of Nanostructures

FSI-TDNAcad. year: 2023/2024

The subject is aimed at the explanation of physical principles of diagnostics of 1D and 2D nanostructures suitable for a study of morphological and structural parameters, as well as of their local properties. The individual methods, fundamentals of their selection and optimization with respect with their lateral resolution will be described. In addition to scanning probe microscopic metods (STM, AFM, EFM, MFM, SNOM, etc.) and electron and ion microscopy (TEM, SEM, etc.) also optical microscopic spectroscopic techniques (e.g. confocal scanning Raman spectroscopy and photoluminiscence) and their combination will be discussed (STL, cathodoluminiscence, TERS, etc.). These methods will be demonstrated and tested as well.

Language of instruction

Czech

Number of ECTS credits

Mode of study

Not applicable.

Guarantor

doc. Ing. Radek Kalousek, Ph.D.

Department

Institute of Physical Engineering (ÚFI)

Entry knowledge

Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films.

Rules for evaluation and completion of the course

The assessment of a student is made upon his performance in practice and quality of a discussion on topics selected at the colloquium (lecture notes allowed at preparation).

The presence of students at practice is obligatory and is monitored by the tutor. The way how to compensate missed practice lessons will be determined by the tutor depending on the extent and content of the missed lessons.

Aims

The goal is to give an overview of the methods providing the diagnostics of 1D and 0D nanostructures concerning both their morphological and structural characteristics and their local electronic, optical, electrical and magnetic properties as well.

Students will learn the current status of a new field called Diagnostics of Nanostructures which will also be of assistance to them for the selection of their diploma and doctoral theses.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Stroscio A., Keiser W. J.: Scanning Tunneling Microscopy, Academic Press, Inc., 1993.
Meyer E., Hug H. J.: Scanning Probe Microscopy, The Lab on a Tip, Springer , 2004.

Type of course unit

Lecture

13 hours, optionally

Teacher / Lecturer

M.Sc. Jon Ander Arregi Uribeetxebarria, Ph.D.
Ing. Petr Bábor, Ph.D.
doc. Ing. Miroslav Bartošík, Ph.D.
prof. Ing. Jan Čechal, Ph.D.
Dr.techn. Ing. Hermann Detz
Dr. techn. Zdeněk Jakub
Ing. Filip Ligmajer, Ph.D.
doc. Dr. Ing. Petr Neugebauer, Ph.D.
Ing. Pavel Procházka, Ph.D.
prof. RNDr. Tomáš Šikola, CSc.
Ing. Michal Urbánek, Ph.D.

Syllabus

Introduction to Scanning Probe Microscopy (SPM); Scanning Tunneling Microscopy (STM) - principles of imaging by tunneling current and operation modes; scanning force microscopy (SFM) - relevant forces and operation modes; atomic force microscopy (AFM), magnetic force microscopy (MFM), electric force microscopy (EFM) and Kelvin force microscopy (KFM); scanning near field optical microscopy (SNOM); other types of SPM; principles of SPM design; electron and ion microscopy and spectroscopy (TEM/EELS, SEM/SAM,aj.); optical microscopy and spectroscopy (e.g. confocal scanning Raman spectroscopy and photoluminiscence); combined methods (STL, cathodoluminiscence, TERS, etc.).

Laboratory exercise

6 hours, compulsory

Teacher / Lecturer

doc. Ing. Radek Kalousek, Ph.D.

Syllabus

See seminars.

Exercise

14 hours, compulsory

Teacher / Lecturer

Syllabus

The calculation of supportive theoretical examples and practical demonstrations and testing take place during the whole semester.

Computer-assisted exercise

6 hours, compulsory

Teacher / Lecturer

doc. Ing. Radek Kalousek, Ph.D.

Syllabus

See seminars.

eLearning

eLearning: currently opened course

VUT

Faculties

University Institutes

Parts

Diagnostics of Nanostructures

Type of course unit