Course detail

Methods of Structure Analysis

FSI-WA1Acad. year: 2018/2019

Optical microscopy(methods,principles,applications),image analysis. Interaction between electrons and samples.. Transmission electron microscopy(TEM,STEM) electron diffraction. Basic principles of HV TEM and HR TEM. Scanning electron microscopy. Environmental SEM. Microanalysis in electron microscopy (X-Ray microanalysis, Auger analysis, Electron energy-loss spectrometry). X-Ray diffractometry.Selected spectroscopic methods. Scanning probe microscopy.Micr- and nanotomography. Raman spectroscopy.

Learning outcomes of the course unit

Students will lern of the principles and application potentials of the basic methods for structural and phase analyses, inclusive of taking and preparing samples.


The study of experimental methods employed in the analysis of the structure (morphology and phase composition) of materials requires the knowledge of physics and mathematics as provided in the course of BSc studies, and also the knowledge of materials sciences and materials engineering at least on the level of a graduate of the Bachelor´s degree of the mechanical engineering study.


Not applicable.

Recommended optional programme components

Not applicable.

Recommended or required reading

GOLDSTEIN, I. Joseph. Scanning electron microscopy and X-ray microanalysis. 3rd ed. New York: Kluwer, 2003, xix, 689 s. : il. + 1 CD-ROM. ISBN 0-306-47292-9. (EN)
BRANDON, David a Wayne D KAPLAN. Microstructural characterization of materials. New York: John Wiley, 1999, 409 s. : il. ISBN 0-471-98501-5. (EN)
ECKERTOVÁ, Ludmila a Luděk FRANK. Metody analýzy povrchů: elektronová mikroskopie a difrakce. Praha: Academia, 1996, 379 s. ISBN 80-200-0329-0. (CS)
FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4. (EN)
WILLIAMS, David Bernard a C. Barry CARTER. Transmission electron microscopy: a textbook for materials science. Second edition. New York: Springer, 2009, lxii, 760, 15 stran : ilustrace (některé barevné) ; 28 cm. ISBN 978-0-387-76500-6. (EN)
KARLÍK, Miroslav. Úvod do transmisní elektronové mikroskopie. Praha: České vysoké učení technické v Praze, 2011, 321 s. : il. (některé barev.) ; 30 cm. ISBN 978-80-01-04729-3. (CS)
FRANK, Luděk a Jaroslav KRÁL. Metody analýzy povrchů: iontové, sondové a speciální metody. Praha: Academia, 2002, 489 s. ISBN 80-200-0594-3. (CS)

Planned learning activities and teaching methods

The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical laboratory work.

Assesment methods and criteria linked to learning outcomes

Exam: written and oral parts. Awarding the course-unit credit is conditional on the elaboration of assigned sets of problems.

Language of instruction


Work placements

Not applicable.


The course objective is to offer students an overview and, to a lesser extent, also the theoretical knowledge and principles of all basic methods for structural and phase analyses (physical principles of methods, instrument parameters, application scope of the methods, etc.), inclusive of sample preparation. Based on practical applications, students will have gained a basic overview of methodological procedures used in solving problems and analysing results.

Specification of controlled education, way of implementation and compensation for absences

Compulsory attendance at exercises. Absence from classes is dealt with individually, usually by make-up exercises.

Classification of course in study plans

  • Programme M2A-P Master's

    branch M-MTI , 1. year of study, summer semester, 5 credits, compulsory
    branch M-FIN , 1. year of study, summer semester, 4 credits, compulsory

Type of course unit



39 hours, optionally

Teacher / Lecturer


1.Introduction to methods of structure analysis, light and confocal microscopy
2.Electron microscopy (electron - sample interaction, basic concepts and ideas, emitors of electrons)
3.Transmission electron microscopy (TEM,STEM)
4. Electron diffraction, dark field, principles of HV TEM and HR TEM
5.Scanning electron microscopy-SEM,low-voltage and environmental SEM, Focusd Ion beam (FIB) microscopy,dual.beam microscopy (FIB/SEM)
6.Local chemical analysis in TEM and SEM (introduction to energy dispersive and wave dispersive spctrometres,EDS detectors), EBSD analysis
7. WDS detectors, Electron Energy Loss Spectroscopy (EELS),Auger
8.Spectroscopy (OES-Optical emission spectroscopy, GDOSES,ICP- OES)
9.Spectroscopy (X-Ray spectroscopy, other type-surface analyzer, combustion etc.)
10.Scanning Probe Microscopy (SPM)
11.Micro- and nanotomography
12.X-Ray diffraction
13.Application of analytical methods in scince,research and for industry

labs and studios

26 hours, compulsory

Teacher / Lecturer


1.Light(Optical) Microscopy,Image analysis
2.Sample preparation for electron microscopy
3.EM laboratory-TEM and STEM-their concept and basic functions
4. Aplication TEM (STEM,HV TEM,HR TEM )-examples
5.SEM-its concept, basic functions, FIB/SEM
6.EDS and EBSD-demonstration of their possibilities and functions
7. WDS and EELS. examples of their possibilities and functions
8. Spectroscopic laboratory -GDOES spectometer,demonstration of analysis and its evaluation
9. Spectroscopic laboratory-spectrometer F/ETA-AAS, analysis and evaluation of results
10. SPM-examples of application possibilities, demonstration of different instruments
11. Laboratora of micro- and nanotomography
12.Laboratory of X-Ray diffraction
13. Examples of selected analytical methods-questions and discussion