Course detail
Methods and Equipment for Technical Diagnostic
FSI-XTDAcad. year: 2017/2018
The course introduces students to the theory of advanced measurement techniques and measuring systems with nanometer resolution.
Supervisor
Department
Learning outcomes of the course unit
Students will acquire skills and experience with respect to measurement methods, application of sensors, and configurations and functional descriptions of measuring instruments.
Prerequisites
Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".
Co-requisites
Not applicable.
Recommended optional programme components
Not applicable.
Recommended or required reading
DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
Halliday,D., Resnick,R., Walker,J.: Fyzika. VUTIUM, 2014.
ANTHONY, D.M. Engineering Metrology. New York: Pergamon Press, 1987.
DOEBELIN, O.D. Measurement Systems. Application and Design. 4. vydání. New York: McGraw-Hill, 1990. 960 s. ISMN 0-07-100697-4.
Električeskije izměrenija nelekričeskich veličin. P.V. Novickij, ed. Leningrad: Energie, 1075. 575 s.
SERWAY, R.A. and BEICHNER, R.J. Physics for Scientist and Engineers with Modern Physics. 5. vydání. Orlando: Saunders College Publisching, 2000. 1551 s.
JENČÍK, J., KUHN, L. a další. Technická měření ve strojírenství. Praha: SNTL, 1982. 580 s.
ORNATSKIJ, P.P. Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976. 431 s.
Planned learning activities and teaching methods
The course is taught through lectures supported by several laboratory experiments.
Assesment methods and criteria linked to learning outcomes
An examination composed from oral and written part. Active participation at laboratory experiments and making valuable reports.
Language of instruction
Czech
Work placements
Not applicable.
Aims
The course focuses on the physical principles of the selected measurement systems.
Specification of controlled education, way of implementation and compensation for absences
Attendance at seminars in labs is required.
Type of course unit
Lecture
13 hours, optionally
Teacher / Lecturer
Syllabus
General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.
Sensors: general classification, capacity sensors, sensors based on induction.
Advanced methods of visualisation and diagnostics: Michalson interferometry, X-ray diffraction, scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.
labs and studios
26 hours, compulsory
Teacher / Lecturer
Syllabus
Laboratory works:
Polarization
Diffraction
Photometry
Wire optics
LCD display
Practical demonstrations:
CT - Computer tomography for industry
LIBS – ablation using pulsed LASER beams
SEM – Scanning Electron Microscopy
AFM - Atomic Force Microscopy
STM – Scanning Tunneling Microscopy