Course detail

Methods of Structure Analysis II

FSI-WA2Acad. year: 2017/2018

The coarse is concerned with:special microscopic and diffraction methods,i.e.confocal microscopy, ion microscopy,dual beam microscopy,low voltage TEM,EXAFS, low electron diffraction,low energy electron SEM,X-Ray microscopy,etc.Methods of surface analysis.Principles of other selected physical methods.

Learning outcomes of the course unit

Students will have a general overview in selected areas and a more in-depth knowledge of the methods of studying structure, substructures, phase and chemical composition of materials.

Prerequisites

The study in this course requires the knowledge of basic experimental methods that are used in the study of the structure of engineering materials (in particular light and electron microscopy, and methods of local chemical analysis in electron microscopes). To understand the content of this course, the knowledge of mathematics, physics and materials sciences is inevitable, at least on the level of a of the Bachelor´s degree of mechanical engineering study.

Co-requisites

Not applicable.

Recommended optional programme components

Not applicable.

Recommended or required reading

FLEWITT, P. E. J a Robert K WILD. Physical methods for materials characterisation. Bristol: Institute of Physics Publishing, 1994, xvi, 517 p. : il. ISBN 0-7503-0320-4. (EN)
BRANDON, David a Wayne D KAPLAN. Microstructural characterization of materials. New York: John Wiley, 1999, 409 s. : il. ISBN 0-471-98501-5. (EN)
KLOUDA, Pavel. Moderní analytické metody. Třetí, upravené vydání. Ostrava: Pavel Klouda - nakladatelství Pavko, 2016, 176 stran : ilustrace ; 24 cm. ISBN 978-80-86369-22-8. (CS)

Planned learning activities and teaching methods

The course is taught through lectures explaining the basic principles and theory of the discipline. Teaching is suplemented by practical laboratory work.

Assesment methods and criteria linked to learning outcomes

The exam has a written and an oral part. Awarding the course-unit credit is conditional on submitting written reports on assigned topics.

Language of instruction

Czech

Work placements

Not applicable.

Aims

The course objective is to make students familiar with the basic methods of structural and phase analyses, and broadens this knowledge to cover methods used in fundamental research as well as methods used in metallurgical analyses and engineering (spectroscopic methods). The objective is to prepare future materials specialists for a quick analysis of an optimum choice of the solving method of a given operation problem or solving problems of both fundamental and applied research.

Specification of controlled education, way of implementation and compensation for absences

Compulsory attendance at laboratory exercises and instruction visits. Absence from exercises is dealt with individually, usually by way of make-up assignment.

Classification of course in study plans

  • Programme M2A-P Master's

    branch M-MTI , 2. year of study, summer semester, 5 credits, compulsory

Type of course unit

 

Lecture

26 hours, optionally

Teacher / Lecturer

Syllabus

1.High resolution electron microscopy
2.Electron microscopy of nanoobjects in SEM (and TEM)-problems and solutions ,
3.Special methods of electron microscopy (low energy electron SEM,low voltage TEM,etc.)
4.Ion beam microscopy,dual beam microscopy,their using for sample preparation and tomography
5.Lorentz microscopy,
6.Principles and applications of selected methods I (acustic emission,laser)
7.Principles and applications of selected methods II (X-Ray microscopy and topography,etc.)
8.and9.Methods of surface analysis (AES,SIMS,SIPS,XPS)
10.Confocal microscopy, holographic microscopy
11.Mössbauer spectroscopy
12,13 Principles and applications of other selected experimental methods (SAXS,NMR,neutron and proton diffraction,elipsometry,ECP,FIM,etc.)

labs and studios

26 hours, compulsory

Teacher / Lecturer

Syllabus

1.Examples of HR TEM and HR STEM applications
2.HR TEM laboratory-demonstration and using
3.Examples of HR SEM applications
4.FIB/SEM laboratory-demonstration of application and possibilities
5.Laboratory of electron litography
6.Laboratory of LIBS
7.Laboratory of Delong Instruments (demo of X-RAY and Mini-TEM)
8.Laboratory of Auger spectroscopy
9.XPS and SIMS laboratory
10.Laboratory of confocal microscopy and holography
11.Laboratory of IPM and TESCAN
12.Experimental possibilities o selected methods
13.Summary, questions, disscusion