Publication detail

Noise Contact Study of CdTe Radiation Detectors

GRMELA, L. ŠIK, O. ŠIKULA, J.

Original Title

Noise Contact Study of CdTe Radiation Detectors

Czech Title

Studie Šumu Kontaktů u Detektorů Ionizujícího Záření na Bázi CdTe

English Title

Noise Contact Study of CdTe Radiation Detectors

Type

conference paper

Language

en

Original Abstract

We have compared noise spectra and charge transport properties analysis results of CdTe radiation detectors: low-ohmic and semi-insulating. We observed assymmetry of IV characteristics of the low-ohmic detector between "normal" nad "reverse" bias, showing improper quality of contacts preparation, which resulted in higher concentration of impurities in M-S interface area. This finding was supported by the fact that the low frequency noise spectral density magnitude was proportional to applied voltage with exponent of 2.7, which is higher than theoretical value 2. The more advanced manufacturing technology of the semi-insulating detector resulted in symmetric contacts IV characteristics and its linear character. Also, this detector showed lower increase of noise spectral density magnitude with exponent of 2.3.

Czech abstract

Cílem příspěvku je srovnání analýz šumové spektrální hustoty a transportních charakteristik detektorů ionizujícího záření na bázi CdTe: nizkoodporového a vysokoodporového vzorku. U nízkoodporového vzorkui jsme pozoroval výraznou nesymetrii VA charakterristik při různých polaritách napájecího napětí, poukazující na špatnou kvalitu výroby kontaktů, jejíž následkem je vyšší koncentrace defektů v oblasti kontaktu polovodič-kov. Toto zjištění bylo posíleno zjištěním, že amplituda šumové spektrální hustoty se zvyšujícím se napájecím narůstala s exponentem 2,7, což je větší hodnota než teoretická 2. Vysokoodporový vzorek, jenž byl vyroben pokročilejší technologií, vykazoval velmi symetrické VA charakteristiky s lineárním průběhem. Tento detektor vykazoval nárůst amplitudy šumové spektr. hustoty s exponentem 2,3.

English abstract

We have compared noise spectra and charge transport properties analysis results of CdTe radiation detectors: low-ohmic and semi-insulating. We observed assymmetry of IV characteristics of the low-ohmic detector between "normal" nad "reverse" bias, showing improper quality of contacts preparation, which resulted in higher concentration of impurities in M-S interface area. This finding was supported by the fact that the low frequency noise spectral density magnitude was proportional to applied voltage with exponent of 2.7, which is higher than theoretical value 2. The more advanced manufacturing technology of the semi-insulating detector resulted in symmetric contacts IV characteristics and its linear character. Also, this detector showed lower increase of noise spectral density magnitude with exponent of 2.3.

Keywords

CdTe, 1/f noise, semiconductor reliability, semiconductor charge transport mechanism

RIV year

2012

Released

17.10.2012

Location

Košice, Slovensko

ISBN

978-80-553-1175-3

Book

Proceedings of the Scientific Conference Physics of Materials 2012

Edition

první

Edition number

1

Pages from

99

Pages to

104

Pages count

6

BibTex


@inproceedings{BUT96521,
  author="Lubomír {Grmela} and Ondřej {Šik} and Josef {Šikula}",
  title="Noise Contact Study of CdTe Radiation Detectors",
  annote="We have compared noise spectra and charge transport properties analysis results of CdTe radiation detectors: low-ohmic and semi-insulating. We observed assymmetry of IV characteristics of the low-ohmic detector between "normal" nad "reverse" bias, showing improper quality of contacts preparation, which resulted in higher concentration of impurities in M-S interface area. This finding was supported by the fact that the low frequency noise spectral density magnitude was  proportional to applied voltage with exponent of 2.7, which is higher than theoretical value 2. The more advanced manufacturing technology of the semi-insulating detector resulted in symmetric contacts IV characteristics and its linear character.  Also, this detector showed lower increase of noise spectral density magnitude with exponent of 2.3.",
  booktitle="Proceedings of the Scientific Conference Physics of Materials 2012",
  chapter="96521",
  edition="první",
  howpublished="print",
  year="2012",
  month="october",
  pages="99--104",
  type="conference paper"
}