Publication detail

Identification of Micro-scale Defects in Crystalline Solar Cell Structure

ŠICNER, J. KOKTAVÝ, P. DALLAEVA, D.

Original Title

Identification of Micro-scale Defects in Crystalline Solar Cell Structure

Type

conference paper

Language

English

Original Abstract

The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could occur in large scale region compare to micro-scale defects.

Keywords

Solar cell, local defect, fractured surface, nondestructive testing.

Authors

ŠICNER, J.; KOKTAVÝ, P.; DALLAEVA, D.

RIV year

2012

Released

26. 8. 2012

Location

Kazaň

ISBN

978-5-905576-18-8

Book

Fracture Mechanics for Durability, Reliability and Safety

Pages from

532

Pages to

539

Pages count

8

BibTex

@inproceedings{BUT96043,
  author="Jiří {Šicner} and Pavel {Koktavý} and Dinara {Sobola}",
  title="Identification of Micro-scale Defects in Crystalline Solar Cell Structure",
  booktitle="Fracture Mechanics for Durability, Reliability and Safety",
  year="2012",
  pages="532--539",
  address="Kazaň",
  isbn="978-5-905576-18-8"
}