Publication detail

Surface Examination of Ultra-sharp Cold Field-Emission Cathode

KNÁPEK, A. MIKMEKOVÁ, Š. BRÜSTLOVÁ, J. TRČKA, T. KLAMPÁR, M.

Original Title

Surface Examination of Ultra-sharp Cold Field-Emission Cathode

English Title

Surface Examination of Ultra-sharp Cold Field-Emission Cathode

Type

conference paper

Language

en

Original Abstract

An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method.

English abstract

An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method.

Keywords

ultra-sharp field-emission cathode, SLEEM, DRS

RIV year

2012

Released

11.10.2012

Location

Brno

ISBN

978-80-214-4594-9

Book

New Trends in Physics, NTF2012, Proceedings of the conference

Edition

první

Edition number

1

Pages from

51

Pages to

56

Pages count

6

Documents

BibTex


@inproceedings{BUT94351,
  author="Alexandr {Knápek} and Šárka {Mikmeková} and Jitka {Brüstlová} and Tomáš {Trčka} and Marián {Klampár}",
  title="Surface Examination of Ultra-sharp Cold Field-Emission Cathode",
  annote="An experimental cold field-emission cathode, based on metal-oxide-insulator structure has been analyzed by several non-destructive evaluation methods in order to describe the material properties and electrical behaviour of the sample. Owing to the fact that the tip of the cathode reaches nanoscopic-scale, several different evaluation methods have been incorporated. Firstly, the scanning electron microscopy (SEM), along with the electron dispersive spectroscopy (EDS) was performed to describe general proportions of the shape and the abundance of elements present in the surface layer. Secondly, the scanning low-energy electron microscopy (SLEEM) was applied in order to visualize the crystalline microstructure of the cathode surface. Finally, the epoxy coating covering the cathode tip was characterised using the dielectric relaxation spectroscopy (DRS) method.",
  booktitle="New Trends in Physics, NTF2012, Proceedings of the conference",
  chapter="94351",
  edition="první",
  howpublished="print",
  year="2012",
  month="october",
  pages="51--56",
  type="conference paper"
}