Publication detail

Determining Effective Testability Degree of Analog Circuits

KINCL, Z. KOLKA, Z.

Original Title

Determining Effective Testability Degree of Analog Circuits

English Title

Determining Effective Testability Degree of Analog Circuits

Type

conference paper

Language

en

Original Abstract

The paper deals with the parametric fault diagnosis of linear analog circuits in the frequency domain. The testability degree, which is referred to as the total number of testable network parameters, is theoretically independent of nominal values of network parameters, the set of test frequencies and the fault detection method. However, practical results show that the effective testability determined numerically using the Singular Value Decomposition of sensitivity matrix (Jacobian) depends on the normalization of network parameters, frequency response measurement methods and a selected set of test frequencies. The differences between the theoretical and the practical testability degree will be discussed on a practical example of RC phase shifter filter.

English abstract

The paper deals with the parametric fault diagnosis of linear analog circuits in the frequency domain. The testability degree, which is referred to as the total number of testable network parameters, is theoretically independent of nominal values of network parameters, the set of test frequencies and the fault detection method. However, practical results show that the effective testability determined numerically using the Singular Value Decomposition of sensitivity matrix (Jacobian) depends on the normalization of network parameters, frequency response measurement methods and a selected set of test frequencies. The differences between the theoretical and the practical testability degree will be discussed on a practical example of RC phase shifter filter.

Keywords

Parametric fault diagnosis, testability degree, test point selection, analog circuit testing.

RIV year

2012

Released

24.05.2012

Publisher

Technical University of Lodz

Location

Warsaw

ISBN

978-1-4577-2092-5

Book

Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems

Pages from

427

Pages to

430

Pages count

4

BibTex


@inproceedings{BUT92191,
  author="Zdeněk {Kincl} and Zdeněk {Kolka}",
  title="Determining Effective Testability Degree of Analog Circuits",
  annote="The paper deals with the parametric fault diagnosis of linear analog circuits in the frequency domain. The testability
degree, which is referred to as the total number of testable network parameters, is theoretically independent of nominal
values of network parameters, the set of test frequencies and the fault detection method. However, practical results show that the
effective testability determined numerically using the Singular Value Decomposition of sensitivity matrix (Jacobian) depends on
the normalization of network parameters, frequency response measurement methods and a selected set of test frequencies. The
differences between the theoretical and the practical testability degree will be discussed on a practical example of RC phase
shifter filter.",
  address="Technical University of Lodz",
  booktitle="Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems",
  chapter="92191",
  howpublished="print",
  institution="Technical University of Lodz",
  year="2012",
  month="may",
  pages="427--430",
  publisher="Technical University of Lodz",
  type="conference paper"
}