Publication detail

Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

ŠIKULA, J., HLÁVKA, J., SEDLÁKOVÁ, V., GRMELA, L., HOSCHL, P., ZEDNÍČEK, T.

Original Title

Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

Czech Title

Vodivostní princip, poruchy a šumové charakteristiky NbO kondenzatorů

English Title

Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors

Type

conference paper

Language

en

Original Abstract

Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitors thermal runaway point, which prevents capacitor burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.

Czech abstract

Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitor thermal runaway point, which prevents capacitors burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.

English abstract

Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitors thermal runaway point, which prevents capacitor burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.

Keywords

Niobium oxide, Capacitors, Passive components, Breakdown

RIV year

2003

Released

01.01.2003

Publisher

Electronic Components Institute Internationale Ltd.

Location

United Kingdom

ISBN

0887-7491

Book

CARTS - EUROPE 2003 Proceedings

Pages from

281

Pages to

285

Pages count

5

BibTex


@inproceedings{BUT9080,
  author="Josef {Šikula} and Jan {Hlávka} and Vlasta {Sedláková} and Lubomír {Grmela} and Pavel {Höschel} and Tomáš {Zedníček}",
  title="Conductivity mechanisms, breakdown and noise characteristics of niobium oxide capacitors",
  annote="Niobium Oxide capacitor, known as OxiCap, has already found its place in the market as a cheap and reliable non-burning component. The study of conductivity mechanisms has been done to prove its excellent stability, reliability and non-burning performance. Set of electrical measurements as VA characteristics in forward and reverse mode, frequency characteristics of capacitance, temperature or time dependency of basic parameters together with measurements of basic physical parameters enabled to propose the theoretical model of NbO – Nb2O5 – MnO2 system. OxiCap shows identical conductivity mechanism as tantalum capacitor, but furthermore a unique mechanism appears after dielectric breakdown. It causes a high resistance failure mode of NbO capacitor and limits the current bellow the capacitors thermal runaway point, which prevents capacitor burning, whereas filtering characteristics remain unchanged. The paper compares the charge carrier transport mechanism and noise of Niobium Oxide capacitor with Niobium and Tantalum capacitors.",
  address="Electronic Components Institute Internationale Ltd.",
  booktitle="CARTS - EUROPE 2003 Proceedings",
  chapter="9080",
  institution="Electronic Components Institute Internationale Ltd.",
  year="2003",
  month="january",
  pages="281",
  publisher="Electronic Components Institute Internationale Ltd.",
  type="conference paper"
}