Publication detail

Panoramic analysis of surface of high-resistance materials by scanning probe microscopy

MAGAMEDOVA, E. BILALOV, B. SOBOLA, D.

Original Title

Panoramic analysis of surface of high-resistance materials by scanning probe microscopy

English Title

Panoramic analysis of surface of high-resistance materials by scanning probe microscopy

Type

conference paper

Language

Russian

Original Abstract

This study describes the panoramic analysis by scanning probe microscopy. It is shown that by analysis with consequent using of several methods and regimes it is possible to obtain reliable and consistent with theory data.

English abstract

This study describes the panoramic analysis by scanning probe microscopy. It is shown that by analysis with consequent using of several methods and regimes it is possible to obtain reliable and consistent with theory data.

Keywords

wide-band-gap semiconductor, probe, scanner, calibration

Key words in English

wide-band-gap semiconductor, probe, scanner, calibration

Authors

MAGAMEDOVA, E.; BILALOV, B.; SOBOLA, D.

Released

18. 5. 2010

Location

Mocsow

Pages from

113

Pages to

114

Pages count

2

BibTex

@inproceedings{BUT76502,
  author="Egana {Magamedova} and Bilal {Bilalov} and Dinara {Sobola}",
  title="Panoramic analysis of surface of high-resistance materials by scanning probe microscopy",
  booktitle="Education in nanotechnology field -modern decision and pespectives",
  year="2010",
  pages="113--114",
  address="Mocsow"
}