Publication detail

Noise Spectroscopy of Thick Film Resistors

SEDLÁKOVÁ, V.

Original Title

Noise Spectroscopy of Thick Film Resistors

English Title

Noise Spectroscopy of Thick Film Resistors

Type

conference paper

Language

en

Original Abstract

The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.

English abstract

The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.

RIV year

2001

Released

01.01.2001

Publisher

ÚFYZ FEI VUT Brno

Location

Brno

ISBN

80-214-1992-X

Book

Sborník příspěvků konference Nové trendy ve fyzice

Pages from

117

Pages to

122

Pages count

6

BibTex


@inproceedings{BUT6838,
  author="Vlasta {Sedláková}",
  title="Noise Spectroscopy of Thick Film Resistors",
  annote="The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.",
  address="ÚFYZ FEI VUT Brno",
  booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
  chapter="6838",
  institution="ÚFYZ FEI VUT Brno",
  year="2001",
  month="january",
  pages="117",
  publisher="ÚFYZ FEI VUT Brno",
  type="conference paper"
}