Publication detail

Microstructure of ultra-fine grained Cu by UHV SLEEM

MIKMEKOVÁ, Š. HOVORKA, M. MÜLLEROVÁ, I. FRANK, L. MAN, O. PANTĚLEJEV, L.

Original Title

Microstructure of ultra-fine grained Cu by UHV SLEEM

Type

abstract

Language

English

Original Abstract

Ultra-fine grained (UFG) materials belong nowadays to front line areas of research in material sciences. The UFG structure can be obtained by means of the equal channel angular pressing (ECAP). We report on study of the grain structure in ECAPed copper using the cathode lens equipped ultrahigh vacuum scanning low energy electron microscope (UHV SLEEM). The grain contrast was found achieving its maximum at electron energies below about 30 eV where it exhibited dependence on electron energy specific for the grain orientation. The energy dependence of the slow electron reflectance seemed to be capable of serving as a fingerprint enabling determination of the crystalline orientation. The very low energy electron reflectance might become an alternative to the electron backscatter diffraction method owing to its high resolution and fast data acquisition.

Keywords

UHV SLEEM, EBSD, ultra-fine grained structure

Authors

MIKMEKOVÁ, Š.; HOVORKA, M.; MÜLLEROVÁ, I.; FRANK, L.; MAN, O.; PANTĚLEJEV, L.

Released

30. 8. 2009

Publisher

Verlag der TU Gratz

Location

Gratz

ISBN

978-3-85125-062-6

Book

MC 2009 GRATZ

Edition

Materials Science

Edition number

1

Pages from

515

Pages to

516

Pages count

2

BibTex

@misc{BUT60792,
  author="Šárka {Mikmeková} and Miloš {Hovorka} and Ilona {Müllerová} and Luděk {Frank} and Ondřej {Man} and Libor {Pantělejev}",
  title="Microstructure of ultra-fine grained Cu by UHV SLEEM",
  booktitle="MC 2009 GRATZ",
  year="2009",
  series="Materials Science",
  edition="1",
  pages="515--516",
  publisher="Verlag der TU Gratz",
  address="Gratz",
  isbn="978-3-85125-062-6",
  note="abstract"
}