Publication detail

Near field photocurrent spectroscopy of crystalline GaAs solar cells

TOMÁNEK, P., GRMELA, L.

Original Title

Near field photocurrent spectroscopy of crystalline GaAs solar cells

Czech Title

Spektroskopie fotoproudu v blízkém poli krystalických GaAs slunečních článků

English Title

Near field photocurrent spectroscopy of crystalline GaAs solar cells

Type

abstract

Language

en

Original Abstract

Visible light Scanning Near-field Optical Microscopy (SNOM) is a relatively new technique that combines the versatility of optical microscopy with the resolution of a scanning probe microscope. Light coupled into a tapered optical fiber is used for excitation and allows a spectroscopic measurements. In this work, we measured the SNOM-induced photocurrent in GaAs devices. Our goal was to obtain spatially resolved measurements of the photocurrent response across the various layers in crystalline GaAs solar cells, by studying the cleaved edges of the cells.

Czech abstract

Rastrovací optická mikroskopie v blízkém poli ve viditelné oblasti je relativně nová technika, která kombinuje všestrannost optického mikroskopu s rozlišením sondových mikroskopů. Světlo vevázané do hrotu optického vlákna excituje vzorek a je možné je použít ke spektroskopickým měřením. Zde je použito k meření SNOM indukovaného fotoproudu na GaAs součástkách. Cílem je dosáhnout měření odezvy fotoproudu různých vrstev krystalického GaAs slunečního článku s vysokým prostorovým rozlišením. K tomu se používá měření na hranách zlomu článků.

English abstract

Visible light Scanning Near-field Optical Microscopy (SNOM) is a relatively new technique that combines the versatility of optical microscopy with the resolution of a scanning probe microscope. Light coupled into a tapered optical fiber is used for excitation and allows a spectroscopic measurements. In this work, we measured the SNOM-induced photocurrent in GaAs devices. Our goal was to obtain spatially resolved measurements of the photocurrent response across the various layers in crystalline GaAs solar cells, by studying the cleaved edges of the cells.

Keywords

Near-field spectroscopy, GaAs, solar cells

Released

13.10.2004

Publisher

Vydavatelstvo STU Bratislava

Location

Trnava

ISBN

80-227-2121-5

Book

CO-MAt-TECH 2004. Proceedings of the Abstracts

Pages from

207

Pages to

207

Pages count

1

BibTex


@misc{BUT59980,
  author="Pavel {Tománek} and Lubomír {Grmela}",
  title="Near field photocurrent spectroscopy of crystalline GaAs solar cells",
  annote="Visible light Scanning Near-field Optical Microscopy (SNOM) is a relatively new technique that combines the versatility of optical microscopy with the resolution of a scanning probe microscope. Light coupled into a tapered optical fiber is used for excitation and allows a spectroscopic measurements. In this work, we measured the SNOM-induced photocurrent in GaAs devices. Our goal was to obtain spatially resolved measurements of the photocurrent response across the various layers in crystalline GaAs solar cells, by studying the cleaved edges of the cells.",
  address="Vydavatelstvo STU Bratislava",
  booktitle="CO-MAt-TECH 2004. Proceedings of the Abstracts",
  chapter="59980",
  institution="Vydavatelstvo STU Bratislava",
  year="2004",
  month="october",
  pages="207",
  publisher="Vydavatelstvo STU Bratislava",
  type="abstract"
}