Publication detail

Noise spectroscopy of thick film

GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J.

Original Title

Noise spectroscopy of thick film

English Title

Noise spectroscopy of thick film

Type

conference paper

Language

en

Original Abstract

Fluctuations of current and light emission in electroluminescent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electrons from localised levels in the gap, impact excitation and impact ionisation of luminiscence centers and radiative transition by hot carriers. Due to high electric field, partial discharges are also sources of current fluctuations. Crystal defects, such as pores, grain boundaries and dislocations may provide regions, where a localised continuum of states bridges the energy gap and allow non-radiative recombination, which is related to current fluctuation. Noise spectroscopy is used to estimate the quality and reliability of thick electroluminiscent layers. In these devices, the overall efficiency is further degraded by absorption, internal reflection and other losses. Brightness versus applied voltage and frequency is used to describe the degradation process and correlation with noise spectral density was used to estimate the quality and reliability of these devices.

English abstract

Fluctuations of current and light emission in electroluminescent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electrons from localised levels in the gap, impact excitation and impact ionisation of luminiscence centers and radiative transition by hot carriers. Due to high electric field, partial discharges are also sources of current fluctuations. Crystal defects, such as pores, grain boundaries and dislocations may provide regions, where a localised continuum of states bridges the energy gap and allow non-radiative recombination, which is related to current fluctuation. Noise spectroscopy is used to estimate the quality and reliability of thick electroluminiscent layers. In these devices, the overall efficiency is further degraded by absorption, internal reflection and other losses. Brightness versus applied voltage and frequency is used to describe the degradation process and correlation with noise spectral density was used to estimate the quality and reliability of these devices.

Keywords

hot carrier, gap, degradation reliability

RIV year

2002

Released

01.07.2002

Publisher

Ing.Zdeněk Novotný, CSc.

Location

Brno

ISBN

80-2389094-8

Book

Noise and Non-linearity Testing of Modern Electronic Componets

Pages from

71

Pages to

72

Pages count

2

BibTex


@inproceedings{BUT5700,
  author="Lubomír {Grmela} and Pavel {Tománek} and Pavel {Koktavý} and Jan {Pavelka} and Josef {Šikula}",
  title="Noise spectroscopy of thick film",
  annote="Fluctuations of current and light emission in electroluminescent lamps based of zinc sulfide phosphor powder embedded in a dielectric layer are presented. Noise sources are emission of electrons from localised levels in the gap, impact excitation and impact ionisation of luminiscence centers and radiative transition by hot carriers. Due to high electric field, partial discharges are also sources of current fluctuations. Crystal defects, such as pores, grain boundaries and dislocations may provide regions, where a localised continuum of states bridges the energy gap and allow non-radiative recombination, which is related to current fluctuation. Noise spectroscopy is used to estimate the quality and reliability of thick electroluminiscent layers. In these devices, the overall efficiency is further degraded by absorption, internal reflection and other losses. Brightness versus applied voltage and frequency is used to describe the degradation process and correlation with noise spectral density was used to estimate the quality and reliability of these devices.",
  address="Ing.Zdeněk Novotný, CSc.",
  booktitle="Noise and Non-linearity Testing of Modern Electronic Componets",
  chapter="5700",
  institution="Ing.Zdeněk Novotný, CSc.",
  year="2002",
  month="july",
  pages="71",
  publisher="Ing.Zdeněk Novotný, CSc.",
  type="conference paper"
}