Publication detail

Nonlinearity and noise of thick film resistors as reliability indicators

ŠIKULA, J. KOKTAVÝ, B. KOKTAVÝ, P. PAVELKA, J. ROČAK, D. BELAVIČ, D.

Original Title

Nonlinearity and noise of thick film resistors as reliability indicators

Type

conference paper

Language

English

Original Abstract

A nonlinearity and noise of thick film resistors made with DuPont resistor pastes 2041 and 8039 were used to make prediction of resistor reliability. The influence of resistor dimension and termination Ag/Pd was evaluated.

Key words in English

nonlinearity, noise, thick film

Authors

ŠIKULA, J.; KOKTAVÝ, B.; KOKTAVÝ, P.; PAVELKA, J.; ROČAK, D.; BELAVIČ, D.

RIV year

2004

Released

1. 1. 1998

Publisher

Electronic Components Institute Internationale Ltd.

Location

UK

Pages from

56

Pages to

61

Pages count

6

BibTex

@inproceedings{BUT4093,
  author="Josef {Šikula} and Bohumil {Koktavý} and Pavel {Koktavý} and Jan {Pavelka} and Dubravka {Ročak} and Darko {Belavič}",
  title="Nonlinearity and noise of thick film resistors as reliability indicators",
  booktitle="Proceedings of 12th European Passive Components Symposium CARTS-Europe '98",
  year="1998",
  pages="6",
  publisher="Electronic Components Institute Internationale Ltd.",
  address="UK"
}