Publication detail

Relay contacts quality screening by non-linearity tester

GRMELA, L., PAVELKA, J., HLÁVKA, J.

Original Title

Relay contacts quality screening by non-linearity tester

English Title

Relay contacts quality screening by non-linearity tester

Type

conference paper

Language

en

Original Abstract

The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.

English abstract

The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.

Keywords

third harmonic, linearity of VA characteristic, current transport

Released

13.09.2001

Publisher

VUT v Brně

Location

Brno

ISBN

80-214-1960-1

Book

Electronic Devices and Systems

Pages from

55

Pages to

55

Pages count

1

BibTex


@inproceedings{BUT3852,
  author="Lubomír {Grmela} and Jan {Pavelka} and Jan {Hlávka}",
  title="Relay contacts quality screening by non-linearity tester",
  annote="The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.",
  address="VUT v Brně",
  booktitle="Electronic Devices and Systems",
  chapter="3852",
  institution="VUT v Brně",
  year="2001",
  month="september",
  pages="55",
  publisher="VUT v Brně",
  type="conference paper"
}