Publication detail

Relay contacts quality screening by non-linearity tester

GRMELA, L., PAVELKA, J., HLÁVKA, J.

Original Title

Relay contacts quality screening by non-linearity tester

English Title

Relay contacts quality screening by non-linearity tester

Type

conference paper

Language

en

Original Abstract

The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.

English abstract

The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.

Released

13.09.2001

Publisher

VUT v Brně

Location

Brno

ISBN

80-214-1960-1

Book

Electronic Devices and Systems

Pages from

55

Pages to

55

Pages count

1

BibTex


@inproceedings{BUT3852,
  author="Lubomír {Grmela} and Jan {Pavelka} and Jan {Hlávka}",
  title="Relay contacts quality screening by non-linearity tester",
  annote="The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.",
  address="VUT v Brně",
  booktitle="Electronic Devices and Systems",
  chapter="3852",
  institution="VUT v Brně",
  year="2001",
  month="september",
  pages="55",
  publisher="VUT v Brně",
  type="conference paper"
}