Publication detail

Complex Visual Analysis of SMD Devices

KALOVÁ, I. HORÁK, K. HONEC, P.

Original Title

Complex Visual Analysis of SMD Devices

English Title

Complex Visual Analysis of SMD Devices

Type

conference paper

Language

en

Original Abstract

The aim of this article is to introduce possibilities of using of computer vision methods for inspection of SMD devices production. Several partial applications of device dimensions measuring and inspection of individual production processes are presented. Most of mentioned tasks require some specialized technique like 3D measuring, double exposure, particular way of lighting.

English abstract

The aim of this article is to introduce possibilities of using of computer vision methods for inspection of SMD devices production. Several partial applications of device dimensions measuring and inspection of individual production processes are presented. Most of mentioned tasks require some specialized technique like 3D measuring, double exposure, particular way of lighting.

Keywords

SMD device, computer vision, visual system, production inspection

RIV year

2009

Released

25.11.2009

Publisher

DAAAM International

Location

Vienna, Austria 2009

ISBN

978-3-901509-70-4

Book

Annals of DAAAM for 2009 & Proceedings of the 20th International DAAAM Symposium

Pages from

233

Pages to

234

Pages count

2

Documents

BibTex


@inproceedings{BUT29772,
  author="Ilona {Janáková} and Karel {Horák} and Peter {Honec}",
  title="Complex Visual Analysis of SMD Devices",
  annote="The aim of this article is to introduce possibilities of using of computer vision methods for inspection of SMD devices production. Several partial applications of device dimensions measuring and inspection of individual production processes are presented. Most of mentioned tasks require some specialized technique like 3D measuring, double exposure, particular way of lighting.",
  address="DAAAM International",
  booktitle="Annals of DAAAM for 2009 & Proceedings of the 20th International DAAAM Symposium",
  chapter="29772",
  howpublished="print",
  institution="DAAAM International",
  year="2009",
  month="november",
  pages="233--234",
  publisher="DAAAM International",
  type="conference paper"
}