Publication detail

Collection Efficiency of the Detector of Secondary Electrons in SEM.

KONVALINA, I., MÜLLEROVÁ, I.

Original Title

Collection Efficiency of the Detector of Secondary Electrons in SEM.

Type

conference paper

Language

English

Original Abstract

In order to collect the secondary electrons (SE), scanning electron microscopes (SEM) are equipped with the Everhart-Thornley (ET) type detector. The electrostatic field of the front grid, biased to a positive potential of several hundred volts , is to attract all SE of kinetic energy below 50 eV or at least those from the SE spectrum peak at 1¸3 eV. However, the detection quantum efficiency (DQE) of such detectors has been found to be significantly lower than one, which is mainly given by their low collection efficiency. The electrostatic field of the grid cannot sufficiently penetrate toward the specimen and influence the trajectories of SE owing to grounded electrodes surrounding the specimen (specimen alone and its holder, specimen stage, pole piece of the objective lens, etc).

Keywords

collection efficiency, ET detector, secondary electrons

Authors

KONVALINA, I., MÜLLEROVÁ, I.

Released

12. 7. 2004

Location

Brno

ISBN

80-239-3246-2

Book

Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Pages from

41

Pages to

42

Pages count

2

BibTex

@inproceedings{BUT21740,
  author="Ivo {Konvalina} and Ilona {Müllerová}",
  title="Collection Efficiency of the Detector of Secondary Electrons in SEM.",
  booktitle="Recent Trends in Charged Particle Optics and Surface Physics Instrumentation",
  year="2004",
  pages="2",
  address="Brno",
  isbn="80-239-3246-2"
}