Publication detail

NetLoiter: A Tool for Automated Testing of Network Applications using Fault-injection

SMRČKA, A. ROZSÍVAL, M.

Original Title

NetLoiter: A Tool for Automated Testing of Network Applications using Fault-injection

Type

conference paper

Language

English

Original Abstract

The reliability of a network is a crucial requirement for applications and systems such as IoT (Internet-of-Things), cloud-based solutions, client-server, or peer-to-peer architectures. Unfortunately, real networks cannot be assumed to be fault-free, especially when considering various hardware problems, performance issues, or even malicious attacks. Testing network applications should include the evaluation of fault-tolerance of a system under various network conditions. The paper introduces a tool which helps developers and verification&validation practitioners easily analyse their network application's behaviour in unexpected network situations. The tool is based on man-in-the-middle and aims at network nodes communicating using a single network interface. The tool implements a fault-injection method; supported faults and attacks are inspired by the real world, including lossy channels, network jitter, data corruption, or disconnections.

Keywords

automated testing,network applications,fault-injection,reliability,network problems

Authors

SMRČKA, A.; ROZSÍVAL, M.

Released

8. 4. 2023

Publisher

Institute of Electrical and Electronics Engineers

Location

Porto

ISBN

979-8-3503-2543-0

Book

Proceedings - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops Volume, DSN-W 2023

Pages from

207

Pages to

210

Pages count

4

URL

https://ieeexplore.ieee.org/document/10207156

BibTex

@inproceedings{BUT184416,
  author="Aleš {Smrčka} and Michal {Rozsíval}",
  title="NetLoiter: A Tool for Automated Testing of Network Applications using Fault-injection",
  booktitle="Proceedings - 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops Volume, DSN-W 2023",
  year="2023",
  pages="207--210",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Porto",
  doi="10.1109/DSN-W58399.2023.00057",
  isbn="979-8-3503-2543-0",
  url="https://ieeexplore.ieee.org/document/10207156"
}