Publication detail

Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis

JAQUES, V. ZIKMUNDOVÁ, E. HOLAS, J. ZIKMUND, T. KAISER, J. HOLCOVÁ, K.

Original Title

Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis

Type

journal article in Web of Science

Language

English

Original Abstract

Scanning electron microscopy (SEM) is a common method for the analysis of painting micro-samples. The high resolution of this technique offers precise surface analysis and can be coupled with an energy-dispersive spectrometer for the acquisition of the elemental composition. For light microscopy and SEM analysis, the painting micro-samples are commonly prepared as cross-sections, where the micro-sample positioned on the side is embedded in a resin. Therefore, the sequence of its layers is exposed after the cross-section is polished. In common cases outside of cultural heritage, a conductive layer is applied on the polished side, but in this field, the measurements are mostly done in low-vacuum SEM (LV-SEM). Although the charging effect is reduced in LV-SEM, it can still occur, and can hardly be prevented even with carbon tape or paint. This work presents two conductive cross-section preparation methods for non-conductive samples, which reduce charging effects without impairing the sample integrity.

Keywords

SEM; Cultural Heritage; Conductivity; Cross-section; Preparation

Authors

JAQUES, V.; ZIKMUNDOVÁ, E.; HOLAS, J.; ZIKMUND, T.; KAISER, J.; HOLCOVÁ, K.

Released

16. 11. 2022

Publisher

Springer Nature

ISBN

2045-2322

Periodical

Scientific Reports

Year of study

12

Number

19650

State

United Kingdom of Great Britain and Northern Ireland

Pages count

13

URL

https://www.nature.com/articles/s41598-022-21882-1

BibTex

@article{BUT180436,
  author="Victory {Jaques} and Eva {Zikmundová} and Jiří {Holas} and Tomáš {Zikmund} and Jozef {Kaiser} and Katarína {Holcová}",
  title="Conductive cross-section preparation of non-conductive painting micro-samples for SEM analysis",
  journal="Scientific Reports",
  year="2022",
  volume="12",
  number="19650",
  pages="13",
  doi="10.1038/s41598-022-21882-1",
  issn="2045-2322",
  url="https://www.nature.com/articles/s41598-022-21882-1"
}