Publication detail

Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

Guen, E. Chapuis, PO. Klapetek, P. Puttock, R. Hay, B. Allard, A. Maxwell, T. Renahy, D. Valtr, M. Martinek, J. Gomes, S.

Original Title

Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

Type

conference paper

Language

English

Original Abstract

We first assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for the simultaneous identification of the local thermal conductivity and phase transition temperature of polymeric materials. In a second step, results of an interlaboratory comparison and an uncertainty analysis involving three laboratories applying the same protocol of phase transition temperature measurement allow evaluating the repeatability, the reproducibility and the reliability of the method.

Keywords

Scanning Thermal Microscopy

Authors

Guen, E.; Chapuis, PO.; Klapetek, P.; Puttock, R.; Hay, B.; Allard, A.; Maxwell, T.; Renahy, D.; Valtr, M.; Martinek, J.; Gomes, S.

Released

26. 9. 2018

ISBN

978-1-5386-6759-0

Book

2018 24TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC)

Pages from

1

Pages to

6

Pages count

6

BibTex

@inproceedings{BUT163752,
  author="Guen, E. and Chapuis, PO. and Klapetek, P. and Puttock, R. and Hay, B. and Allard, A. and Maxwell, T. and Renahy, D. and Valtr, M. and Martinek, J. and Gomes, S.",
  title="Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison",
  booktitle="2018 24TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC)",
  year="2018",
  pages="1--6",
  isbn="978-1-5386-6759-0"
}