Publication detail

Supercapacitor Degradation and Reliability

KUPAROWITZ, T. SEDLÁKOVÁ, V. ŠIKULA, J. MAJZNER, J. SEDLÁK, P.

Original Title

Supercapacitor Degradation and Reliability

English Title

Supercapacitor Degradation and Reliability

Type

conference paper

Language

en

Original Abstract

Degradation of supercapacitor (SC) is analyzed by accelerated aging test. Evolution of SC parameters is determined before the aging test, and during up to 8x10 5 cycles of both 75% and 100% energy cycling. Capacitance fading, equivalent series resistance (ESR) increase, and leakage current trend are analyzed for off-the-shelf CapXX SC. Presented model consists of five parameters. These are Helmholtz and diffuse double layer capacitances, esponsible for SC overall capacity. Next there is time dependent resistance in between Helmholtz and diffuse capacitances. And an ordinary ESR, and resistance responsible for SCs leakage current. Fading of both capacitances is modeled by exponential equation. Increase of ESR AC component is modeled by linear function.

English abstract

Degradation of supercapacitor (SC) is analyzed by accelerated aging test. Evolution of SC parameters is determined before the aging test, and during up to 8x10 5 cycles of both 75% and 100% energy cycling. Capacitance fading, equivalent series resistance (ESR) increase, and leakage current trend are analyzed for off-the-shelf CapXX SC. Presented model consists of five parameters. These are Helmholtz and diffuse double layer capacitances, esponsible for SC overall capacity. Next there is time dependent resistance in between Helmholtz and diffuse capacitances. And an ordinary ESR, and resistance responsible for SCs leakage current. Fading of both capacitances is modeled by exponential equation. Increase of ESR AC component is modeled by linear function.

Keywords

Supercapacitor, Aging test, Capacitance fading, Equivalent series resistance fading, Leakage current fading, Life-time

Released

12.09.2017

ISBN

978-80-905768-8-9

Book

Passive Components Networking days EPCI Passive Components Networking Symposium 2017

Pages from

63

Pages to

68

Pages count

6

BibTex


@inproceedings{BUT141571,
  author="Tomáš {Kuparowitz} and Vlasta {Sedláková} and Josef {Šikula} and Jiří {Majzner} and Petr {Sedlák}",
  title="Supercapacitor Degradation and Reliability",
  annote="Degradation of supercapacitor (SC) is analyzed by accelerated aging test. Evolution of SC parameters is determined before the aging test, and during up to 8x10 5 cycles of both 75% and 100% energy cycling. Capacitance fading, equivalent series resistance (ESR) increase, and leakage current trend are analyzed for off-the-shelf CapXX SC. Presented model consists of five parameters. These are Helmholtz and diffuse double layer capacitances, esponsible for SC overall capacity. Next there is time dependent resistance in between Helmholtz and diffuse capacitances. And an ordinary ESR, and resistance responsible for SCs leakage current. Fading of both capacitances is modeled by exponential equation. Increase of ESR AC component is modeled by linear function.",
  booktitle="Passive Components Networking days EPCI Passive Components Networking Symposium 2017",
  chapter="141571",
  howpublished="electronic, physical medium",
  year="2017",
  month="september",
  pages="63--68",
  type="conference paper"
}