Publication detail

Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

DVOŘÁK, P. ÉDES, Z. KVAPIL, M. ŠAMOŘIL, T. LIGMAJER, F. HRTOŇ, M. KALOUSEK, R. KŘÁPEK, V. DUB, P. SPOUSTA, J. VARGA, P. ŠIKOLA, T.

Original Title

Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

English Title

Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state

Type

journal article in Web of Science

Language

en

Original Abstract

Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer, which gave us all the degrees of freedom necessary for our investigation. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images, and to show that the out-of-plane component generally dominates within a broad range of parameters explored in our study. Our results challenge the widespread notion that this component does not couple to the a-SNOM probe and indicate that the issue of SNOM probe sensitivity towards the in-plane and out-of-plane near-field components – one of the most challenging tasks of near field interference SNOM measurements – is not yet fully resolved.

English abstract

Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer, which gave us all the degrees of freedom necessary for our investigation. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images, and to show that the out-of-plane component generally dominates within a broad range of parameters explored in our study. Our results challenge the widespread notion that this component does not couple to the a-SNOM probe and indicate that the issue of SNOM probe sensitivity towards the in-plane and out-of-plane near-field components – one of the most challenging tasks of near field interference SNOM measurements – is not yet fully resolved.

Keywords

plasmonics ; components ; spectroscopy ; interferometric imaging

Released

05.07.2017

Publisher

Optical Society of America

Pages from

16560

Pages to

16573

Pages count

13

URL

Full text in the Digital Library

BibTex


@article{BUT135516,
  author="Petr {Dvořák} and Zoltán {Édes} and Michal {Kvapil} and Tomáš {Šamořil} and Filip {Ligmajer} and Martin {Hrtoň} and Radek {Kalousek} and Vlastimil {Křápek} and Petr {Dub} and Jiří {Spousta} and Peter {Varga} and Tomáš {Šikola}",
  title="Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state",
  annote="Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer, which gave us all the degrees of freedom necessary for our investigation. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images, and to show that the out-of-plane component generally dominates within a broad range of parameters explored in our study. Our results challenge the widespread notion that this component does not couple to the a-SNOM probe and indicate that the issue of SNOM probe sensitivity towards the in-plane and out-of-plane near-field components – one of the most challenging tasks of near field interference SNOM measurements – is not yet fully resolved.",
  address="Optical Society of America",
  chapter="135516",
  doi="10.1364/OE.25.016560",
  howpublished="online",
  institution="Optical Society of America",
  number="14",
  volume="25",
  year="2017",
  month="july",
  pages="16560--16573",
  publisher="Optical Society of America",
  type="journal article in Web of Science"
}