Publication detail

Microstructural Defects of Solar Cells Investigated by a Variety Diagnostic Methods

ŠKVARENINA, Ľ.

Original Title

Microstructural Defects of Solar Cells Investigated by a Variety Diagnostic Methods

Type

conference paper

Language

English

Original Abstract

This paper discusses the application of a variety diagnostic methods applicable to the solar cells. More objective results about solar cells quality and reliability are possible to obtain by using a various methods. Diagnostic methods described in this paper are based on a dark and illuminated J–V characteristics, a investigation of noise in a wide range of frequency and a radiation detection at a di erent spectral range, namely by an electroluminescence and a thermography method. These methods are primarily more appropriate for a detection or a localization of microstructure defects when a reverse-bias stress is applied. However, the analysis of a forward-bias conditions is included in an investigation of J–V characteristics as well.

Keywords

Solar Cells, J–V curve, Noise, Electroluminescence, Thermal Imaging, Defects

Authors

ŠKVARENINA, Ľ.

Released

28. 4. 2016

Publisher

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních

Location

Brno

ISBN

978-80-214-5350-0

Book

Proceedings of the 22nd Conference STUDENT EEICT 2016

Edition number

1.

Pages from

743

Pages to

747

Pages count

777

URL

http://www.feec.vutbr.cz/EEICT/2016/sbornik/EEICT-2016-sborník-komplet.pdf

BibTex

@inproceedings{BUT124461,
  author="Ľubomír {Škvarenina}",
  title="Microstructural Defects of Solar Cells Investigated by a Variety Diagnostic Methods",
  booktitle="Proceedings of the 22nd Conference STUDENT EEICT 2016",
  year="2016",
  number="1.",
  pages="743--747",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních",
  address="Brno",
  isbn="978-80-214-5350-0",
  url="http://www.feec.vutbr.cz/EEICT/2016/sbornik/EEICT-2016-sborník-komplet.pdf"
}