Publication detail
Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations
HAVEL, J. HEROUT, A. JURÁNKOVÁ, M.
Original Title
Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations
English Title
Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations
Type
journal article - other
Language
en
Original Abstract
Some variants of the Hough transform can be used for detecting vanishing points and groups of concurrent lines. This article addresses a common misconception that in the polar line parameterization the vanishing point is represented by a line. The numerical error caused by this inaccuracy is then estimated. The article studies in detail point-to-line-mappings (PTLMs) -- a class of line parameterizations which have the property that the vanishing point is represented by a line (and thus can be easily searched for). When a PTLM parameterization is used for the straight line detection by the Hough transform, a pair or a triplet of complementary PTLMs has to be used in order to obtain a limited Hough space. The complementary pairs and triplets of PTLMs are formalized and discussed in this article.
English abstract
Some variants of the Hough transform can be used for detecting vanishing points and groups of concurrent lines. This article addresses a common misconception that in the polar line parameterization the vanishing point is represented by a line. The numerical error caused by this inaccuracy is then estimated. The article studies in detail point-to-line-mappings (PTLMs) -- a class of line parameterizations which have the property that the vanishing point is represented by a line (and thus can be easily searched for). When a PTLM parameterization is used for the straight line detection by the Hough transform, a pair or a triplet of complementary PTLMs has to be used in order to obtain a limited Hough space. The complementary pairs and triplets of PTLMs are formalized and discussed in this article.
Keywords
line parameterization, Hough transform, vanishing points, camera calibration
RIV year
2013
Released
18.01.2013
Publisher
NEUVEDEN
Location
NEUVEDEN
ISBN
0167-8655
Periodical
PATTERN RECOGNITION LETTERS
Year of study
2013
Number
34
State
NL
Pages from
703
Pages to
708
Pages count
6
Documents
BibTex
@article{BUT103449,
author="Jiří {Havel} and Adam {Herout} and Markéta {Juránková}",
title="Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations",
annote="Some variants of the Hough transform can be used for detecting vanishing points
and groups of concurrent lines. This article addresses a common misconception
that in the polar line parameterization the vanishing point is represented by
a line. The numerical error caused by this inaccuracy is then estimated.
The article studies in detail point-to-line-mappings (PTLMs) -- a class of line
parameterizations which have the property that the vanishing point is represented
by a line (and thus can be easily searched for). When a PTLM parameterization is
used for the straight line detection by the Hough transform, a pair or a triplet
of complementary PTLMs has to be used in order to obtain a limited Hough space.
The complementary pairs and triplets of PTLMs are formalized and discussed in
this article.",
address="NEUVEDEN",
chapter="103449",
doi="10.1016/j.patrec.2013.01.020",
edition="NEUVEDEN",
howpublished="print",
institution="NEUVEDEN",
number="34",
volume="2013",
year="2013",
month="january",
pages="703--708",
publisher="NEUVEDEN",
type="journal article - other"
}