Publication detail

Optical and Thermal Activities of Micro-Sized Local Defects on the Edges of Silicon Solar Cells

ŠICNER, J.

Original Title

Optical and Thermal Activities of Micro-Sized Local Defects on the Edges of Silicon Solar Cells

Type

conference paper

Language

English

Original Abstract

The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity and optical spectrum.

Keywords

Solar cell, local defect, nondestructive testing

Authors

ŠICNER, J.

RIV year

2012

Released

26. 4. 2012

Publisher

LITERA Brno

Location

Brno

ISBN

978-80-214-4462-1

Book

proceedings of the 16th conference student eeict 2012 vol. 3

Edition number

3

Pages from

288

Pages to

292

Pages count

5

BibTex

@inproceedings{BUT92570,
  author="Jiří {Šicner}",
  title="Optical and Thermal Activities of Micro-Sized Local Defects on the Edges of Silicon Solar Cells",
  booktitle="proceedings of the 16th conference student eeict 2012 vol. 3",
  year="2012",
  number="3",
  pages="288--292",
  publisher="LITERA Brno",
  address="Brno",
  isbn="978-80-214-4462-1"
}