Publication detail

Noise and Non-linearity as Reliability Indicators of Electronic Devices

ŠIKULA, J., DOBIS, P.

Original Title

Noise and Non-linearity as Reliability Indicators of Electronic Devices

Type

conference paper

Language

English

Original Abstract

An aplication of noise and non-linearity measurements in analysis, diagnostic and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typicaly feature of these methods. Conceptions of 1/f noise, burst noise or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. The results of noise and non-linearity measurements are shown. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.

Key words in English

Noise, Non-linearity, Reliability, Electronic Devices

Authors

ŠIKULA, J., DOBIS, P.

RIV year

2003

Released

1. 1. 2003

Publisher

MIDEM - Society for Microelectronics, Electronic components and Materials

Location

Slovenia

ISBN

961-91023-1-2

Book

MIDEM Cenference 2003 Proceedings

Pages from

3

Pages to

14

Pages count

12

BibTex

@inproceedings{BUT9082,
  author="Josef {Šikula} and Pavel {Dobis}",
  title="Noise and Non-linearity as Reliability Indicators of Electronic Devices",
  booktitle="MIDEM Cenference 2003 Proceedings",
  year="2003",
  pages="12",
  publisher="MIDEM - Society for Microelectronics, Electronic components and Materials",
  address="Slovenia",
  isbn="961-91023-1-2"
}