Publication detail

Analysis of photon emision from silicon solar cells and correlation with microplasma noise

MACKŮ, R.

Original Title

Analysis of photon emision from silicon solar cells and correlation with microplasma noise

English Title

Analysis of photon emision from silicon solar cells and correlation with microplasma noise

Type

conference paper

Language

en

Original Abstract

Camera has been used for mapping of surface photon emission in this study CCD. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Defects are often problem because of the increasing current density and the local temperature. In addition, degradation and/or irreversible destruction go hand in hand with this phenomenon. We managed to get information about localized bulk spots using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists in this paper. The results related to several defect spots are presented in detail in this paper.

English abstract

Camera has been used for mapping of surface photon emission in this study CCD. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Defects are often problem because of the increasing current density and the local temperature. In addition, degradation and/or irreversible destruction go hand in hand with this phenomenon. We managed to get information about localized bulk spots using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists in this paper. The results related to several defect spots are presented in detail in this paper.

Keywords

solar cell, nondestructive testing, imperfections

RIV year

2011

Released

29.04.2011

Publisher

Novpress

Location

Brno

ISBN

978-80-214-4273-3

Book

proceedings of the 17th conference student eeict 2011 vol. 3

Edition number

1

Pages from

417

Pages to

421

Pages count

5

BibTex


@inproceedings{BUT75599,
  author="Robert {Macků}",
  title="Analysis of photon emision from silicon solar cells and correlation with microplasma noise",
  annote="Camera has been used for mapping of surface photon emission in this study CCD. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Defects are often problem because of the increasing current density and the local temperature. In addition, degradation and/or irreversible destruction go hand in hand with this phenomenon. We managed to get information about localized bulk spots using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists in this paper. The results related to several defect spots are presented in detail in this paper.",
  address="Novpress",
  booktitle="proceedings of the 17th conference student eeict 2011 vol. 3",
  chapter="75599",
  howpublished="print",
  institution="Novpress",
  year="2011",
  month="april",
  pages="417--421",
  publisher="Novpress",
  type="conference paper"
}