Publication detail

Impact of Local Defects on Photon Emission, Electric Current Fluctuation and Reliability of Silicon Solar Cells Studied by Electro-Optical Methods

MACKŮ, R. KOKTAVÝ, P.

Original Title

Impact of Local Defects on Photon Emission, Electric Current Fluctuation and Reliability of Silicon Solar Cells Studied by Electro-Optical Methods

English Title

Impact of Local Defects on Photon Emission, Electric Current Fluctuation and Reliability of Silicon Solar Cells Studied by Electro-Optical Methods

Type

journal article

Language

en

Original Abstract

This paper, for the first time, investigates localized defects of silicon solar cells. These imperfections represent real problem because of solar cell long-term degradation and decreasing conversion efficiency. To solve this issue, this paper does systematic research about optical investigation of local defect spots and correlation with rectangular microplasma fluctuation. Sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Nevertheless, we confine ourselves to bulk defects of potential barrier. We managed to get interesting information using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper.

English abstract

This paper, for the first time, investigates localized defects of silicon solar cells. These imperfections represent real problem because of solar cell long-term degradation and decreasing conversion efficiency. To solve this issue, this paper does systematic research about optical investigation of local defect spots and correlation with rectangular microplasma fluctuation. Sensitive CCD camera has been used for mapping of surface photon emission. The operation point of the samples has been set to reverse bias mode and the different electric field intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the edges. Nevertheless, we confine ourselves to bulk defects of potential barrier. We managed to get interesting information using combination of optical investigations and electrical noise measurement in the time and spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the results related to several defect spots are presented in detail in this paper.

Keywords

solar cell, photon emission, silicon, reverse bias

RIV year

2011

Released

27.06.2011

Publisher

ZČU

Location

Plzeň

Pages from

38

Pages to

43

Pages count

6

BibTex


@article{BUT75595,
  author="Robert {Macků} and Pavel {Koktavý}",
  title="Impact of Local Defects on Photon Emission, Electric Current Fluctuation and Reliability of Silicon Solar Cells Studied by Electro-Optical Methods",
  annote="This paper, for the first time, investigates localized defects of silicon solar cells. These imperfections represent
real problem because of solar cell long-term degradation and decreasing conversion efficiency. To solve this
issue, this paper does systematic research about optical investigation of local defect spots and correlation with
rectangular microplasma fluctuation. Sensitive CCD camera has been used for mapping of surface photon
emission. The operation point of the samples has been set to reverse bias mode and the different electric field
intensity was applied. It turns out, that some solar cells exhibit an imperfection in the bulk and close to the
edges. Nevertheless, we confine ourselves to bulk defects of potential barrier. We managed to get interesting
information using combination of optical investigations and electrical noise measurement in the time and
spectral domain. It will be revealed that a direct correlation between noise and photon emission exists and the
results related to several defect spots are presented in detail in this paper.",
  address="ZČU",
  chapter="75595",
  institution="ZČU",
  number="2",
  volume="2011",
  year="2011",
  month="june",
  pages="38--43",
  publisher="ZČU",
  type="journal article"
}