Publication detail

Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure

MACKŮ, R. KOKTAVÝ, P. ŠKARVADA, P.

Original Title

Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure

English Title

Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure

Type

journal article

Language

en

Original Abstract

This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed.

English abstract

This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed.

Keywords

Solar cell, Microplasma noise, Non-destructive testing, Local defect

RIV year

2011

Released

10.01.2011

Publisher

Trans Tech Publications

Location

Switzerland

Pages from

314

Pages to

317

Pages count

4

BibTex


@article{BUT50266,
  author="Robert {Macků} and Pavel {Koktavý} and Pavel {Škarvada}",
  title="Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure",
  annote="This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed.",
  address="Trans Tech Publications",
  chapter="50266",
  institution="Trans Tech Publications",
  number="1",
  volume="465",
  year="2011",
  month="january",
  pages="314--317",
  publisher="Trans Tech Publications",
  type="journal article"
}