Publication detail

Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices

NOVOTNÝ, R.

Original Title

Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices

English Title

Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices

Type

journal article - other

Language

Czech

Original Abstract

Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here.

English abstract

Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here.

Keywords

design, experiment, factor, multi-vari analysis, optimization, response, variation

Key words in English

design, experiment, factor, multi-vari analysis, optimization, response, variation

Authors

NOVOTNÝ, R.

RIV year

2008

Released

1. 1. 2008

Publisher

World Scientific and Engineering Academy and Society (WSEAS)

Location

Istanbul, Turkey

ISBN

1790-5117

Periodical

WSEAS Applied Informatics & Communications

Year of study

2008

Number

1

State

Hellenic Republic

Pages from

105

Pages to

108

Pages count

4

BibTex

@article{BUT49206,
  author="Radovan {Novotný}",
  title="Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices",
  journal="WSEAS Applied Informatics & Communications",
  year="2008",
  volume="2008",
  number="1",
  pages="105--108",
  issn="1790-5117"
}