Publication detail

Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices

NOVOTNÝ, R.

Original Title

Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices

Czech Title

Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices

Language

cs

Original Abstract

Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here.

Czech abstract

Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here.

Documents

BibTex 


@article{BUT49206,
  author="Radovan {Novotný}",
  title="Empirical modeling in the area of technological process optimization and optimization of the burn-in process of electronic devices",
  annote="Monitor the microelectronics structures stability, consistency and overall performance need to study variation and influence of various technological factors. This article presents some important aspects related to the observation and analysis of the influence more than one variable at a time on the response of interest. Examples for creating maps of performance stability for supposed device operating conditions and related experience of realized studies are recapitulated here.",
  address="World Scientific and Engineering Academy and Society (WSEAS)",
  chapter="49206",
  institution="World Scientific and Engineering Academy and Society (WSEAS)",
  journal="WSEAS Applied Informatics & Communications",
  number="1",
  volume="2008",
  year="2008",
  month="january",
  pages="105--108",
  publisher="World Scientific and Engineering Academy and Society (WSEAS)",
  type="journal article - other"
}