Publication detail

Microplasma noise as a tool for PN junctions diagnostics

KOKTAVÝ, P. MACKŮ, R. PARAČKA, P. KRČÁL, O.

Original Title

Microplasma noise as a tool for PN junctions diagnostics

English Title

Microplasma noise as a tool for PN junctions diagnostics

Type

journal article - other

Language

en

Original Abstract

The present paper deals with noise diagnostics of PN junctions in semiconductor devices. The general tool to be employed here is the microplasma noise, which arises in reverse biased PN junctions containing local defects featuring lower breakdown voltage than the rest PN junction. When a high electric field is applied to this PN junction, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested devices possible.

English abstract

The present paper deals with noise diagnostics of PN junctions in semiconductor devices. The general tool to be employed here is the microplasma noise, which arises in reverse biased PN junctions containing local defects featuring lower breakdown voltage than the rest PN junction. When a high electric field is applied to this PN junction, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested devices possible.

Keywords

noise diagnostics, quality, PN junction, microplasma, avalanche breakdown, impact ionization

RIV year

2008

Released

10.01.2008

Publisher

WSEAS

Pages from

186

Pages to

191

Pages count

6

BibTex


@article{BUT48686,
  author="Pavel {Koktavý} and Robert {Macků} and Petr {Paračka} and Ondřej {Krčál}",
  title="Microplasma noise as a tool for PN junctions diagnostics",
  annote="The present paper deals with noise diagnostics of PN junctions in semiconductor devices. The general tool to be employed here is the microplasma noise, which arises in reverse biased PN junctions containing local defects featuring lower breakdown voltage than the rest PN junction. When a high electric field is applied to this PN junction, local breakdowns arises in micro-sized regions, which in turn can lead to the deterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested devices possible.",
  address="WSEAS",
  chapter="48686",
  institution="WSEAS",
  journal="WSEAS Transactions on Electronics",
  number="9",
  volume="4",
  year="2008",
  month="january",
  pages="186--191",
  publisher="WSEAS",
  type="journal article - other"
}