Publication detail

Charge carrier transport and noise of niobium capacitors

ŠIKULA, J., PAVELKA, J., DOBIS, P., ZEDNÍČEK, T.

Original Title

Charge carrier transport and noise of niobium capacitors

Type

conference paper

Language

English

Original Abstract

A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can be used to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences.

Key words in English

Noise, niobium capacitor, spectral density

Authors

ŠIKULA, J., PAVELKA, J., DOBIS, P., ZEDNÍČEK, T.

RIV year

2002

Released

20. 10. 2002

Publisher

Electronic Components Institute Internationale, Ltd.

Location

SWINDON, England

Pages from

32

Pages to

36

Pages count

5

BibTex

@inproceedings{BUT4821,
  author="Josef {Šikula} and Jan {Pavelka} and Pavel {Dobis} and Tomáš {Zedníček}",
  title="Charge carrier transport and noise of niobium capacitors",
  booktitle="Proceeding of CARTS 2002 - 16th European Passive Components Conference",
  year="2002",
  pages="5",
  publisher="Electronic Components Institute Internationale, Ltd.",
  address="SWINDON, England"
}