Publication detail

X-ray investigations of nanopowder WO3 thick films

KHATKO, V. GUIRADO, F. HUBÁLEK, J. LLOBET, E. CORREIG, X.

Original Title

X-ray investigations of nanopowder WO3 thick films

English Title

X-ray investigations of nanopowder WO3 thick films

Type

journal article

Language

en

Original Abstract

Nanoparticle tungsten trioxide thick films based on commercial WO3 nanopowder and powder mixtures with different concentrations of metals (Ag, In and Bi) were prepared by screen-printing onto alumina substrates. The changes in phase composition, crystallite size and cell parameters induced in tungsten trioxide thick films by the inclusion of metal impurities were investigated by X-ray diffraction (XRD). Some of the samples were further analysed using a high temperature XRD method.

English abstract

Nanoparticle tungsten trioxide thick films based on commercial WO3 nanopowder and powder mixtures with different concentrations of metals (Ag, In and Bi) were prepared by screen-printing onto alumina substrates. The changes in phase composition, crystallite size and cell parameters induced in tungsten trioxide thick films by the inclusion of metal impurities were investigated by X-ray diffraction (XRD). Some of the samples were further analysed using a high temperature XRD method.

Keywords

Nanoparticles, tungsten trioxide, thick films

RIV year

2005

Released

26.07.2005

Pages from

1973

Pages to

1979

Pages count

7

BibTex


@article{BUT45521,
  author="Vienteslav {Khatko} and F {Guirado} and Jaromír {Hubálek} and Eduard {Llobet} and Xavier {Correig}",
  title="X-ray investigations of nanopowder WO3 thick films",
  annote="Nanoparticle tungsten trioxide thick films based on commercial WO3 nanopowder and powder mixtures
with different concentrations of metals (Ag, In and Bi) were prepared by screen-printing onto alumina substrates. The changes in phase composition, crystallite size and cell parameters induced in tungsten trioxide
thick films by the inclusion of metal impurities were investigated by X-ray diffraction (XRD).
Some of the samples were further analysed using a high temperature XRD method.",
  chapter="45521",
  journal="physica status solidi",
  number="10",
  volume="202",
  year="2005",
  month="july",
  pages="1973",
  type="journal article"
}