Publication detail
Diagnostics of analogue integrated circuits
KOLAŘÍK, V., MUSIL, V.
Original Title
Diagnostics of analogue integrated circuits
English Title
Diagnostics of analogue integrated circuits
Type
conference paper
Language
en
Original Abstract
Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings
English abstract
Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings
RIV year
2001
Released
12.09.2001
Publisher
Ing. Zdeněk Novotný, CSc.
Location
Brno
ISBN
80-214-1960-1
Book
Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings
Pages from
60
Pages to
67
Pages count
8
BibTex
@inproceedings{BUT4536,
author="Vladimír {Kolařík} and Vladislav {Musil}",
title="Diagnostics of analogue integrated circuits",
annote="Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings",
address="Ing. Zdeněk Novotný, CSc.",
booktitle="Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings",
chapter="4536",
institution="Ing. Zdeněk Novotný, CSc.",
year="2001",
month="september",
pages="60",
publisher="Ing. Zdeněk Novotný, CSc.",
type="conference paper"
}