Publication detail

Diagnostics of analogue integrated circuits

KOLAŘÍK, V., MUSIL, V.

Original Title

Diagnostics of analogue integrated circuits

English Title

Diagnostics of analogue integrated circuits

Type

conference paper

Language

en

Original Abstract

Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings

English abstract

Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings

RIV year

2001

Released

12.09.2001

Publisher

Ing. Zdeněk Novotný, CSc.

Location

Brno

ISBN

80-214-1960-1

Book

Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings

Pages from

60

Pages to

67

Pages count

8

BibTex


@inproceedings{BUT4536,
  author="Vladimír {Kolařík} and Vladislav {Musil}",
  title="Diagnostics of analogue integrated circuits",
  annote="Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings",
  address="Ing. Zdeněk Novotný, CSc.",
  booktitle="Electronic Devices and Systems EDS 01. Noise and Non-Linearity Testing of Modern Electronics Components - Workshop. Proceedings",
  chapter="4536",
  institution="Ing. Zdeněk Novotný, CSc.",
  year="2001",
  month="september",
  pages="60",
  publisher="Ing. Zdeněk Novotný, CSc.",
  type="conference paper"
}