Publication detail

Optical nanoscale investigation of surface characterics

TOMÁNEK, P.

Original Title

Optical nanoscale investigation of surface characterics

Type

journal article in Web of Science

Language

English

Original Abstract

In the paper some basic near field theoretical approaches will be explained as well as the principles of microsocpe set-ups. Application items as nanoscale topography with lateral superresolution, local spectroscopy of semiconductors, local fluorescence of dielectric films and achieving of higher data density of the recording medium will be also presented.

Key words in English

near field optics, scanning probe microscopy, nanoscale characterization, topography, local spectroscopy, local fluorescence

Authors

TOMÁNEK, P.

RIV year

1999

Released

11. 5. 1999

Publisher

SPIE

Location

Bellingham, USA

ISBN

0277-786X

Periodical

Proceedings of SPIE

Year of study

3904

Number

1

State

United States of America

Pages from

398

Pages to

406

Pages count

9

BibTex

@article{BUT37584,
  author="Pavel {Tománek}",
  title="Optical nanoscale investigation of surface characterics",
  journal="Proceedings of SPIE",
  year="1999",
  volume="3904",
  number="1",
  pages="9",
  issn="0277-786X"
}