Publication detail

Thickness measurement of thin dielectric films by evanescent total reflection fluorescence

BENEŠOVÁ, M. TOMÁNEK, P.

Original Title

Thickness measurement of thin dielectric films by evanescent total reflection fluorescence

Type

journal article - other

Language

English

Original Abstract

The electric filed of an evanescent wave generates fluorescence in the interface between dielectric surface and the adjacent, fluorescing, medium of lower refractive index. The difference between the fluorescing signals from covered and noncovered area are compared.

Keywords

thin film, dielectric, fluorescence, attenuation

Authors

BENEŠOVÁ, M.; TOMÁNEK, P.

RIV year

1999

Released

21. 10. 1999

Publisher

Blackwell Science

Location

Oxford, UK

ISBN

0022-2720

Periodical

Journal of Microscopy

Year of study

194

Number

2/3

State

United Kingdom of Great Britain and Northern Ireland

Pages from

434

Pages to

438

Pages count

5

BibTex

@article{BUT37583,
  author="Markéta {Benešová} and Pavel {Tománek}",
  title="Thickness measurement of thin dielectric films by evanescent total reflection fluorescence",
  journal="Journal of Microscopy",
  year="1999",
  volume="194",
  number="2/3",
  pages="434--438",
  issn="0022-2720"
}