Publication detail

Scanning near-field optical microscopy

ŠKARVADA, P.

Original Title

Scanning near-field optical microscopy

English Title

Scanning near-field optical microscopy

Type

conference paper

Language

en

Original Abstract

Optical microscopy with local probe in the near field has several advantages against other microscopy types. Main advantages are: easy use, minimal preparation of sample and possibility to get some extra information about sample. There are two basic modes: reflection mode and transmission mode. For sample surface topography measuring fiber quartz system based on shear forces between the tip and sample is used. Topography of sample is important because it allows to keep the distance between the tip and the sample surface constant and this is necessary for increasing the signal to noise ratio. As a probe is being used a metal coated optical fiber taper. During the scanning it is possible to get some extra information. In the case of reflection mode microscope configuration it is local reflection of sample. This characteristic of sample allows specifying some defects of the structure.

English abstract

Optical microscopy with local probe in the near field has several advantages against other microscopy types. Main advantages are: easy use, minimal preparation of sample and possibility to get some extra information about sample. There are two basic modes: reflection mode and transmission mode. For sample surface topography measuring fiber quartz system based on shear forces between the tip and sample is used. Topography of sample is important because it allows to keep the distance between the tip and the sample surface constant and this is necessary for increasing the signal to noise ratio. As a probe is being used a metal coated optical fiber taper. During the scanning it is possible to get some extra information. In the case of reflection mode microscope configuration it is local reflection of sample. This characteristic of sample allows specifying some defects of the structure.

Keywords

Near-field optical microscopy, SNOM, Shear forces, Topography, Reflectivity

RIV year

2007

Released

14.11.2007

Publisher

Ing. Zdeněk Novotný Csc.

Location

Brno

ISBN

978-80-7355-078-3

Book

New Trends in Physics

Edition number

první

Pages from

274

Pages to

277

Pages count

4

BibTex


@inproceedings{BUT28526,
  author="Pavel {Škarvada}",
  title="Scanning near-field optical microscopy",
  annote="Optical microscopy with local probe in the near field has several advantages against other microscopy types. Main advantages are: easy use, minimal preparation of sample and possibility to get some extra information about sample. There are two basic modes: reflection mode and transmission mode. For sample surface topography measuring fiber quartz system based on shear forces between the tip and sample is used. Topography of sample is important because it allows to keep the distance between the tip and the sample surface constant and this is necessary for increasing the signal to noise ratio. As a probe is being used a metal coated optical fiber taper. During the scanning it is possible to get some extra information. In the case of reflection mode microscope configuration it is local reflection of sample. This characteristic of sample allows specifying some defects of the structure.",
  address="Ing. Zdeněk Novotný Csc.",
  booktitle="New Trends in Physics",
  chapter="28526",
  howpublished="print",
  institution="Ing. Zdeněk Novotný Csc.",
  year="2007",
  month="november",
  pages="274--277",
  publisher="Ing. Zdeněk Novotný Csc.",
  type="conference paper"
}