Publication detail

Solar cell surface local reflaction and pn junction area measurement

ŠKARVADA, P.

Original Title

Solar cell surface local reflaction and pn junction area measurement

English Title

Solar cell surface local reflaction and pn junction area measurement

Type

conference paper

Language

en

Original Abstract

The objective of this paper is focused on study of solar cell parameters by advanced microscopy methods. Scanning Near-field Optical Microscopy (SNOM) is very useful modern tool for sample topography and surface reflectivity measurements. Using this, it is possible to determine pn junction area, localize some structure errors and investigate sample surface with submicron even subwavelength details. Accurate value of pn junction area is important parameter of solar cells, which is used for barrier capacitance calculations and improvement of solar cell effective value.

English abstract

The objective of this paper is focused on study of solar cell parameters by advanced microscopy methods. Scanning Near-field Optical Microscopy (SNOM) is very useful modern tool for sample topography and surface reflectivity measurements. Using this, it is possible to determine pn junction area, localize some structure errors and investigate sample surface with submicron even subwavelength details. Accurate value of pn junction area is important parameter of solar cells, which is used for barrier capacitance calculations and improvement of solar cell effective value.

Keywords

Scanning near-field optical microscopy, solar cell, pn junction area, local reflection

RIV year

2008

Released

24.04.2008

Publisher

Ing. Zdeněk Novotný CSc.

Location

Brno

ISBN

978-80-214-3617-6

Book

Proceedings of the 14th conference Student EEICT 2008 volume 4

Edition number

1

Pages from

317

Pages to

321

Pages count

4

BibTex


@inproceedings{BUT26339,
  author="Pavel {Škarvada}",
  title="Solar cell surface local reflaction and pn junction area measurement",
  annote="The objective of this paper is focused on study of solar cell parameters by advanced microscopy methods. Scanning Near-field Optical Microscopy (SNOM) is very useful modern tool for sample topography and surface reflectivity measurements. Using this, it is possible to determine pn junction area, localize some structure errors and investigate sample surface with submicron even subwavelength details. Accurate value of pn junction area is important parameter of solar cells, which is used for barrier capacitance calculations and improvement of solar cell effective value.",
  address="Ing. Zdeněk Novotný CSc.",
  booktitle="Proceedings of the 14th conference Student EEICT 2008 volume 4",
  chapter="26339",
  howpublished="print",
  institution="Ing. Zdeněk Novotný CSc.",
  year="2008",
  month="april",
  pages="317--321",
  publisher="Ing. Zdeněk Novotný CSc.",
  type="conference paper"
}