Publication detail

Sputtered nylon as passivation layers of silicon solar cells

HÉGR, O. BOUŠEK, J.

Original Title

Sputtered nylon as passivation layers of silicon solar cells

English Title

Sputtered nylon as passivation layers of silicon solar cells

Type

conference paper

Language

en

Original Abstract

In this article a first test of thin polymeric layers deposition using by RF magnetron sputtering is described. The layer was sputtered on the polished silicon wafer from nylon target. The main aim was to find passivation possibilities on the silicon solar cells surface. The sputtered layers are characterized by mw-PCD method for the minority carrier lifetime measurement (and evaluation of the surface recombination velocity) and X-ray spectroscopy (XPS) for the element constitution of sputtered layers.

English abstract

In this article a first test of thin polymeric layers deposition using by RF magnetron sputtering is described. The layer was sputtered on the polished silicon wafer from nylon target. The main aim was to find passivation possibilities on the silicon solar cells surface. The sputtered layers are characterized by mw-PCD method for the minority carrier lifetime measurement (and evaluation of the surface recombination velocity) and X-ray spectroscopy (XPS) for the element constitution of sputtered layers.

Keywords

silicon solar cell, sputtering, nylon, MW-PCD

RIV year

2007

Released

20.09.2007

Publisher

Ing. Zdeněk Novotný CSc., Brno

ISBN

978-80-214-3470-7

Book

EDS 2007 - 2

Edition number

1

Pages from

421

Pages to

424

Pages count

4

BibTex


@inproceedings{BUT25669,
  author="Ondřej {Hégr} and Jaroslav {Boušek}",
  title="Sputtered nylon as passivation layers of silicon solar cells",
  annote="In this article a first test of thin polymeric layers deposition using by RF magnetron sputtering is described. The layer was sputtered on the polished silicon wafer from nylon target. The main aim was to find passivation possibilities on the silicon solar cells surface. The sputtered layers are characterized by mw-PCD method for the minority carrier lifetime measurement (and evaluation of the surface recombination velocity) and X-ray spectroscopy (XPS) for the element constitution of sputtered layers.",
  address="Ing. Zdeněk Novotný CSc., Brno",
  booktitle="EDS 2007 - 2",
  chapter="25669",
  institution="Ing. Zdeněk Novotný CSc., Brno",
  year="2007",
  month="september",
  pages="421",
  publisher="Ing. Zdeněk Novotný CSc., Brno",
  type="conference paper"
}