Publication detail

Minority carriers lifetime in Si PV cells with sputtered passivation

Ondřej Hégr, Jaroslav Boušek

Original Title

Minority carriers lifetime in Si PV cells with sputtered passivation

English Title

Minority carriers lifetime in Si PV cells with sputtered passivation

Type

conference paper

Language

en

Original Abstract

Thin layers of silicon nitride are routinely used as passivation layers for solar cells. For deposition of SiNx films the main advantage of magnetron sputtering technology is low process temperature. The amount of the crystal lattice deffect decrease when using this low-temperature process. For determination of recombination parameters we used microwave-detected photo-conductance decay (MW-PCD). The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by company Solartec (Czech republic).

English abstract

Thin layers of silicon nitride are routinely used as passivation layers for solar cells. For deposition of SiNx films the main advantage of magnetron sputtering technology is low process temperature. The amount of the crystal lattice deffect decrease when using this low-temperature process. For determination of recombination parameters we used microwave-detected photo-conductance decay (MW-PCD). The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by company Solartec (Czech republic).

Keywords

passivation layers, silicon nitride, magnetron sputtering, MW-PCD, lifetime

Released

01.01.2006

Publisher

nakl. Z. Novotný

ISBN

960-8025-99-8

Book

Socrates workshop 2006

Pages from

177

Pages to

182

Pages count

6

BibTex


@inproceedings{BUT24711,
  author="Ondřej {Hégr} and Jaroslav {Boušek} and Jaroslav {Sobota} and Radim {Bařinka} and Aleš {Poruba}",
  title="Minority carriers lifetime in Si PV cells with sputtered passivation",
  annote="Thin layers of silicon nitride are routinely used as passivation layers for solar cells. For deposition of SiNx films the main advantage of magnetron sputtering technology is low process temperature. The amount of the crystal lattice deffect decrease when using this low-temperature process. For determination of recombination parameters we used microwave-detected photo-conductance decay (MW-PCD). The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by company Solartec (Czech republic).",
  address="nakl. Z. Novotný",
  booktitle="Socrates workshop 2006",
  chapter="24711",
  institution="nakl. Z. Novotný",
  number="1",
  year="2006",
  month="january",
  pages="177",
  publisher="nakl. Z. Novotný",
  type="conference paper"
}