Publication detail

Fast transients in testing of solar cells PN-junction.

J.Boušek

Original Title

Fast transients in testing of solar cells PN-junction.

English Title

Fast transients in testing of solar cells PN-junction.

Type

conference paper

Language

en

Original Abstract

Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 – 500 mV was used. The voltage bias was made with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.

English abstract

Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 – 500 mV was used. The voltage bias was made with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.

Keywords

Solar cells, reverse breakdown voltage, minority carrier lifetime, recombination, diffusion capacitance

RIV year

2005

Released

10.12.2005

Publisher

Nakl. Novotný

Location

Brno

ISBN

80-214-3042-7

Book

Socrates Workshop

Pages from

121

Pages to

126

Pages count

6

BibTex


@inproceedings{BUT20915,
  author="Jaroslav {Boušek}",
  title="Fast transients in testing of solar cells PN-junction.",
  annote="Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The measurement and evaluation procedure is very simple and no expensive devices are needed. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 – 500 mV was used. The voltage bias was made with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.",
  address="Nakl. Novotný",
  booktitle="Socrates Workshop",
  chapter="20915",
  institution="Nakl. Novotný",
  year="2005",
  month="december",
  pages="121",
  publisher="Nakl. Novotný",
  type="conference paper"
}